Shay,

The important part is to have a parallel beam analyzer (crystal, parallel plate 
collimator or equivalent). The analyzer will then define the 2-theta position, 
not the sample.

A more interesting question is regarding the intensities. Sample displacement 
will affect intensities in parallel beam geometry. The relationship depends on 
many factors, e.g. fixed or symmetric incident angle, surface roughness, sample 
transparency, flat plate or capillary, …


Jeff

Jeffrey Nicolich, Ph.D. | Principal Scientist
GCP Applied Technologies
62 Whittemore Avenue | Cambridge, MA 02140 | T +1 617.498.3816 | 
jeffrey.nicol...@gcpat.com<mailto:jeffrey.nicol...@gcpat.com>

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From: rietveld_l-requ...@ill.fr [mailto:rietveld_l-requ...@ill.fr] On Behalf Of 
Martin Vickers
Sent: Thursday, February 02, 2017 1:21 PM
To: Shay Tirosh
Cc: rietveld_l@ill.fr
Subject: Re: 2-teta shift due to sample displacement in parallel beam

Hi, Shay. The sample displacement / peak-position relationship is equivalent.

Martin

On 2 February 2017 at 15:14, Shay Tirosh 
<stiro...@gmail.com<mailto:stiro...@gmail.com>> wrote:
Dear Rietvelders

Does the 2-teta shift due to sample displacement in parallel beam is similar to 
Bragg Brentano mode?
If not then what is the mathematical expression in parallel beam?

Thanks

Shay
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_________________________________________________

Dr. Shay Tirosh
Institute for Nanotechnology & Advanced Materials
Bar Ilan University
Ramat Gan, 52900
Israel
Phone: +972-(0)30-531-7320
Mobile: +972-(0)54-8834533<tel:+972%2054-883-4533>
Email: stiro...@gmail.com<mailto:stiro...@gmail.com>
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