Hi Shay Not only specimen displacement, but also line broadening and relative intensities. They will all depend on the layer thickness.
I don't know how well it would work, especially as WC is quite a heavy absorber, but in principle, it could. You could also try fixed incident been geometry (asymmetric reflection) and look at the influence of incident angle on the WC peaks. That could also help tie things down. Additionally, the intensity of the substrate peaks would also depend on the layer thickness. Some equations for line profiles of thin specimens and intensity corrections for asymmetric reflection can be found here: Rowles & Buckley, J. Appl. Cryst. (2017). 50 <http://journals.iucr.org/j/services/archive.html>, 240- <http://journals.iucr.org/j/issues/2017/01/00/kc5052/>251 Hope this helps. Matthew On 8 Feb 2017 00:40, "Shay Tirosh" <stiro...@gmail.com> wrote: Dear Rietvelders Say I had a thin layer of weakly crystalline (WC) material on top of a crystalline material. Obviously when aligning the sample it brings the crystalline material below the focal plane. Is it possible to determine the WC material thickness by using the shift in 2-teta of the substrate? What are the limitations? Are there publications that has been utilized this method and tackle the problems like layer transparency? Thanks Shay -- _________________________________________________ Dr. Shay Tirosh Institute for Nanotechnology & Advanced Materials Bar Ilan University Ramat Gan, 52900 Israel Phone: +972-(0)30-531-7320 Mobile: +972-(0)54-8834533 <+972%2054-883-4533> Email: stiro...@gmail.com _________________________________________________ ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ Please do NOT attach files to the whole list <alan.he...@neutronoptics.com> Send commands to <lists...@ill.fr> eg: HELP as the subject with no body text The Rietveld_L list archive is on http://www.mail-archive.com/ rietveld_l@ill.fr/ ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
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