This is a one-time announcement. Please contact me off list with any discussion.
Arney Computer Systems is currently seeking a number of beta test installation sites to install, test and provide feedback to us on the new High Speed Dynamic Trace feature of our Trap Diagnostic Facility (TDF) z/OS assembler software debugging product. This is a non-interactive trace facility where the traced code executes at near native machine speed. It can be used to resolve software issues that cannot be debugged in an interactive manner. This includes problems such as interactions between tasks in a multi-tasking environment, storage management or resource sharing serialization issues where the timing difference in an interactive mode changes or masks the error. It can also be used for code running in an environment that cannot be supported in an interactive mode such as code holding locks. Multiple tasks residing in one or many address spaces can be traced as a single unit. Re-usable traces can be developed and run against multiple versions of a program making it useful for change verification, regression or even quality assurance testing. The trace is completely dynamic with no code changes required to the traced code. The trace viewer ISPF application is used to format the collected trace data for display and analysis. It has both Filter and Find facilities to give you multiple views of the data combined with a powerful search ability. We will be doing a web demo of the trace facility on Wednesday Nov. 13th at 1:00 pm CST for interested beta testers. If you are interested in being a beta tester and want more information please email me and I will send you an invitation to the demo meeting on Wednesday or we can make other arrangements that better suite your needs. Thanks for considering this offer! Chuck Arney Arney Computer Systems 214-306-0754 zosdebug.com
