We've just collected a number of inverse beam data sets. It turns out the crystals showed little radiation damage, so we have a lot of data: 2 x 360 deg for each crystal, broken up into 30 deg wedges. The collection order went like this: 0-30 deg, 180-210, 30-60, 210-240, etc.
Now, assuming no slippage, I could simply integrate the first set of data (non-inverse?) in one run: 0-360 deg. However, since the 12 individual wedges making up this 360 deg sweep were not collected immediately one after the other, I don't expect the scale factors for individual images to vary smoothly (there should be discontinuities at the boundaries between wedges). If I do integrate the data in one fell swoop, am I in danger of introducing errors? For example, I seem to recall that denzo had built-in restraints to ensure that scale factors for adjacent images didn't vary by too much. Is there a similar restraint that in XDS that I might run afoul of? The alternative is to integrate each each wedge separately, but with 24 wedges per xtal, this is starting to look a little tedious. Cheers, Pat
