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SYNCHROTRON BEAM TIME FOR MACROMOLECULAR CRYSTALLOGRAPHY AT SLS
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Proposal application deadline:   Wednesday, June 15, 2011

Periods:
September 1, 2011 - December 31, 2011 (Normal / Test proposals)
September 1, 2011 - August 31, 2012 (Long-term proposals)

Proposal submission:
http://www.psi.ch/sls/px-beamlines-call-for-proposals

Travel support:
http://www.psi.ch/useroffice/sls-elisa

PSI DUO application for iphone:
http://itunes.apple.com/ch/app/psi-duo/id375328818?mt=8

News:
- PILATUS detector runs two times faster (25 Hz vs. 12.5 Hz) at X06SA, which 
offers faster fine-phi slicing data collection.
- X10SA accepts proposals for combined single crystal diffraction and UV-Vis, 
fluorescence and Raman spectroscopy studies (R. Owen, et al., JSR, 2009, 16, 
173)
- In-situ X-ray diffraction screening in user operation at X06DA with any SBS 
format plate (R. Bingel-Erlenmeyer, et al., Crystal Growth & Design 2011, 11, 
916)
- Automatic sample changer (IRELEC CATS) with SPINE pucks, vials, and caps 
(MOLECULAR DIMENSIONS) available at all beamlines (except on the MD2 station).

X06SA Beamline features (http://www.psi.ch/sls/pxi/pxi)
- Undulator beamline with flux of 2x10^12 photons/sec at 12.4 keV (1Å) and 
fully tunable from 6.0 to 17.5 keV (2.07 - 0.71 Å)
- Focused beam size and divergency: HRD - 85x10 microns and 0.35x0.06 mrad; MD2 
- 25x5 microns and 0.5x0.4 mrad  
- PILATUS 6M pixel detector at the High Resolution Diffractometer, allowing 
continuous, fine phi-sliced data acquisition (25 frames per second) with 20 bit 
dynamic range (see http://pilatus.web.psi.ch/  or www.dectris.com for further 
information)
- MAR225 CCD at Micro-Diffractometer MD2, allowing data collection with a 
focussed beam size of 25 x 5 micrometers, and down to 10 x 5 micrometer using 
an aperture.

X06DA Beamline features (http://www.psi.ch/sls/pxiii/pxiii)
- Super-bending magnet beamline with flux of 5x10¹¹ photons/sec at 12.4 keV 
(1Å) and fully tunable from 6.0 to 17.5 keV (2.07 - 0.71 Å)
- Focused beam size and divergency: 80x45 microns and 2x0.5 mrad (with 
possibility to reduce horizontal divergency to 0.4 mrad)
- Mini-hutch design for fast manual mounting
- MAR225 CCD detector
- In-situ  X-ray diffraction screening (with any SBS format plate) available 
during users shifts (R. Bingel-Erlenmeyer, et al., Crystal Growth & Design 
2011, 11, 916)

X10SA Beamline features (http://www.psi.ch/sls/pxii/pxii)
- Undulator beamline with flux of 2x10^12 photons/sec at 12.4 keV (1Å) and 
fully tunable from 6.0 to 20 keV (2.07 - 0.62 Å)
- Focused beam size and divergency: 50x10 microns and 0.6x0.1 mrad
- In-situ on-axis single crystal UV-Vis, fluorescence, Raman and Resonance 
Raman microspectrophotometer (http://www.psi.ch/sls/pxii/spectrolab)
- PILATUS 6M pixel detector

Best regards,

The MX group at SLS


__________________________________
Meitian Wang
Swiss Light Source at Paul Scherrer Institut
CH-5232 Villigen PSI - http://www.psi.ch/sls/
Phone: +41 56 310 4175
Fax:     +41 56 310 5292 

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