Dear Crystallographers, it seems to me that for clearly identifying/characterising anomalous scatterers for a solved structure, one could make a map using two datasets: one at the f" peak, one low energy remote. One would then use the signal both from the Bijvoet differences in the peak dataset plus the differences between the peak and low-energy datasets, which I think I have seen called "dispersive" differences. I guess this would be like a MAD map, but using pre-existing model phases--is there such an animal in the software, or would it even be helpful?
Jacob Keller -- ******************************************* Jacob Pearson Keller Northwestern University Medical Scientist Training Program cel: 773.608.9185 email: [email protected] *******************************************
