On Tue, 17 Jul 2012 06:26:39 +0000, LEGRAND Pierre <pierre.legr...@synchrotron-soleil.fr> wrote:
> Hi Jason, > > To answer your initial question about overlaps versus finer slicing, you can > get a good description of the problem in Fig10 > of Z. Dauter article "Data-collection strategies" (open access article here: > http://journals.iucr.org/d/issues/1999/10 > /00/ba0020/ba0020.pdf). > > From the initial cell parameters, XDS calculates the "Maximum oscillation > range to prevent angular overlap at high > resolution limit" (bottom of the IDXREF.LP file). This calculation assumes > zero mosaicity, and crystal in the worst orientation: > with the longest axis perpendicular to the spindle axis. It is not true that this list in IDXREF.LP assumes the crystal to be in the worst orientation. Rather, it refers to the crystal in its _current_ orientation! I think this is a more useful piece of information once the crystal is indexed. best, Kay
