On Thu, 22 May 2025 19:55:34 GMT, Sergey Bylokhov <s...@openjdk.org> wrote:
>> Recent AWT test updates have UI creation wrapped in EDT. I have seen many >> reviewers recommend using EDT even with AWT components. >> >> Recently came across another PR where EDT is recommended. >> https://github.com/openjdk/jdk/pull/25278#discussion_r2098939094 >> https://github.com/openjdk/jdk/pull/25278#discussion_r2100689626 > > For external use in apps we can recommend it so it will be unified for swing > and awt, but for internal use we cannot simply switch to EDT as a cleanup or > a bug fix. The code related to awt/2d runs in various threads and must be > properly synchronized. @mrserb I can remove the EDT but I do think retaining them will stabilize this test based on the context of test failure. - Test does NOT fail when it is run multiple times on macos-aarch64 but only when entire test suite is run. Can it still be synchronization issue if it is not reproducible when test is run multiple times? - The test repeated fails on macos-aarch64 only when the entire test suite is run so I suspect this could be the effect of couple of Graphics tests that was recently open-sourced and indeed this matches with the timeline that this test started to fail repeatedly on macos-aarch64. - I didn't see any recent source code changesets that has direct relation to this test failure. There was one recent change to copyArea and ongoing subsequent change https://github.com/openjdk/jdk/pull/25340 but the test does not hit the code path in Blit.c or MaskBlit.c so that eliminates these changes as the cause. ------------- PR Review Comment: https://git.openjdk.org/jdk/pull/25279#discussion_r2110529825
