Wednesday ***Special day and time*** February 28 1:00 - 1:50 PM Kelley 1001
Dr. Lee Barford Master Scientist Agilent Laboratories, Santa Clara, CA Clock Synchronization for Sensors, Measurement, and Data Analysis Time is an important consideration in the design of systems that sense the physical world. Usually a measurement must be taken at a certain time, at certain time intervals, or at the same time as another measurement. Traditionally, measurement systems have used synchronous hardware to control measurement times. The emergence of geographically distributed measurement systems and sensor networks and the ubiquity of digital networks---from desktop to planetary scale---make it desirable to do measurement using asynchronous, networked devices. The synchronicity needed for measurement is obtained by synchronizing a real time clock within each device. Such synchronization can be performed using widely available wireless services ( e.g. Global Positioning System) or network protocols (e.g. IEEE 1588 Precision Time Protocol). Measurements can then be time triggered, that is, a measurement happens when a real time clock reaches a pre-determined time. Alternatively, measurements can be time stamped, where the time that each measurement occurs is due to external factors but the measurement time is accurately and precisely recorded. The talk concludes with a description of new algorithms for data analysis of time stamped measurements, for example filtering and spectral analysis. Biography: Lee Barford is a Master Scientist in the Measurements Laboratory of Agilent Laboratories in Palo Alto, California. Lee has a bachelor's degree in Computer Science from Temple University, and an MS and Ph.D. in Computer Science and Operations Research from Cornell University. After a short stint teaching at Cornell, Lee became a Member of the Technical Staff at Hewlett-Packard Laboratories in 1987. In 1996 he was promoted to Senior Member of the Technical Staff. In 2000, HP spun off its technology businesses (measurement, test, semiconductors, chemical analysis, and biotechnology) into a new company, Agilent Technologies. Lee became part of Agilent Laboratories at that time. In 2003, Lee was promoted to Master Scientist. In addition to diagnosis, at Hewlett-Packard Labs and Agilent Labs Lee has worked in a number of other research areas, including mechanical CAD systems, wavelet signal processing, networked sensors, automated X-ray test of electronics, and behavioral modeling of nonlinear dynamical systems. His current research interest is applying Bayesian methods to improving speed and accuracy of measurement and test.
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