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The following commit(s) were added to refs/heads/master by this push:
new 3cbda8a24 mtd_config_fs: support align size test
3cbda8a24 is described below
commit 3cbda8a24c1fe81922bba08acad8dc99354aa24e
Author: zhaoxingyu1 <[email protected]>
AuthorDate: Tue Mar 19 10:08:38 2024 +0800
mtd_config_fs: support align size test
Originally 1-byte alignment, now supports n-byte alignment
Signed-off-by: zhaoxingyu1 <[email protected]>
---
testing/mtd_config_fs/mtd_config_fs_test_main.c | 134 ++++++++++++++++--------
1 file changed, 91 insertions(+), 43 deletions(-)
diff --git a/testing/mtd_config_fs/mtd_config_fs_test_main.c
b/testing/mtd_config_fs/mtd_config_fs_test_main.c
index ed5f701ef..e4bbf1bcf 100644
--- a/testing/mtd_config_fs/mtd_config_fs_test_main.c
+++ b/testing/mtd_config_fs/mtd_config_fs_test_main.c
@@ -48,6 +48,8 @@
****************************************************************************/
/* Configuration ************************************************************/
+#define NVS_ALIGN_SIZE CONFIG_MTD_WRITE_ALIGN_SIZE
+#define NVS_ALIGN_UP(x) (((x) + NVS_ALIGN_SIZE - 1) &
~(NVS_ALIGN_SIZE - 1))
#define TEST_KEY1 "testkey1"
#define TEST_KEY2 "testkey2"
@@ -62,14 +64,21 @@
begin_packed_struct struct nvs_ate
{
- uint32_t id; /* data id */
- uint16_t offset; /* data offset within sector */
- uint16_t len; /* data len within sector */
- uint16_t key_len; /* key string len */
- uint8_t part; /* part of a multipart data - future extension */
- uint8_t crc8; /* crc8 check of the ate entry */
- uint8_t expired; /* 0xFF-newest entry, others-old entry */
- uint8_t reserved[3]; /* for future extension */
+ uint32_t id; /* Data id */
+ uint16_t offset; /* Data offset within block */
+ uint16_t len; /* Data len within block */
+ uint16_t key_len; /* Key string len */
+ uint8_t part; /* Part of a multipart data - future extension */
+ uint8_t crc8; /* Crc8 check of the ate entry */
+#if CONFIG_MTD_WRITE_ALIGN_SIZE <= 4
+ /* stay compatible with situation which align byte be 1 */
+
+ uint8_t expired[NVS_ALIGN_SIZE];
+ uint8_t reserved[4 - NVS_ALIGN_SIZE];
+#else
+ uint8_t padding[NVS_ALIGN_UP(12) - 12];
+ uint8_t expired[NVS_ALIGN_SIZE];
+#endif
} end_packed_struct;
/* Pre-allocated simulated flash */
@@ -183,7 +192,7 @@ static void fill_ate(FAR struct mtdnvs_ctx_s *ctx, FAR
struct nvs_ate *ate,
ate->offset = offset;
ate->key_len = strlen(key) + 1;
fill_crc8_update(ate);
- ate->expired = expired ? 0x7f : 0xff;
+ ate->expired[0] = expired ? 0x7f : 0xff;
}
/****************************************************************************
@@ -487,6 +496,7 @@ static void test_nvs_corrupt_expire(struct mtdnvs_ctx_s
*ctx)
uint8_t erase_value = ctx->erasestate;
struct config_data_s data;
char rd_buf[50];
+ size_t padding_size;
printf("%s: test begin\n", __func__);
@@ -513,6 +523,18 @@ static void test_nvs_corrupt_expire(struct mtdnvs_ctx_s
*ctx)
goto test_fail;
}
+ padding_size = NVS_ALIGN_UP(sizeof(TEST_KEY1) + sizeof(TEST_DATA1))
+ - sizeof(TEST_KEY1) - sizeof(TEST_DATA1);
+ for (i = 0; i < padding_size; i++)
+ {
+ ret = write(mtd_fd, &erase_value, sizeof(erase_value));
+ if (ret != sizeof(erase_value))
+ {
+ printf("%s:write data1 padding failed, ret=%d\n", __func__, ret);
+ goto test_fail;
+ }
+ }
+
/* write valid data again, simulate overwrite data */
ret = write(mtd_fd, TEST_KEY1, strlen(TEST_KEY1) + 1);
@@ -531,9 +553,9 @@ static void test_nvs_corrupt_expire(struct mtdnvs_ctx_s
*ctx)
/* set unused flash to 0xff */
- for (i = 2 * (strlen(TEST_KEY1) + strlen(TEST_DATA1) + 2);
- i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 4 * 16;
- i++)
+ for (i = 2 * (strlen(TEST_KEY1) + strlen(TEST_DATA1) + 2) + padding_size;
+ i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - 4 * sizeof(struct nvs_ate); i++)
{
ret = write(mtd_fd, &erase_value, sizeof(erase_value));
if (ret != sizeof(erase_value))
@@ -546,7 +568,7 @@ static void test_nvs_corrupt_expire(struct mtdnvs_ctx_s
*ctx)
/* Write ate */
fill_ate(ctx, &ate, TEST_KEY1, strlen(TEST_DATA2) + 1,
- strlen(TEST_KEY1) + strlen(TEST_DATA1) + 2, false);
+ strlen(TEST_KEY1) + strlen(TEST_DATA1) + 2 + padding_size, false);
ret = write(mtd_fd, &ate, sizeof(ate));
if (ret != sizeof(ate))
{
@@ -575,7 +597,8 @@ static void test_nvs_corrupt_expire(struct mtdnvs_ctx_s
*ctx)
/* write close ate, mark section 0 as closed */
fill_close_ate(ctx, &ate,
- CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 4 * 16);
+ CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - 4 * sizeof(struct nvs_ate));
ret = write(mtd_fd, &ate, sizeof(ate));
if (ret != sizeof(ate))
{
@@ -672,6 +695,7 @@ static void test_nvs_corrupted_write(struct mtdnvs_ctx_s
*ctx)
uint8_t erase_value = ctx->erasestate;
struct nvs_ate ate;
struct config_data_s data;
+ size_t padding_size;
printf("%s: test begin\n", __func__);
@@ -700,6 +724,18 @@ static void test_nvs_corrupted_write(struct mtdnvs_ctx_s
*ctx)
goto test_fail;
}
+ padding_size = NVS_ALIGN_UP(sizeof(key1) + sizeof(wr_buf_1))
+ - sizeof(key1) - sizeof(wr_buf_1);
+ for (i = 0; i < padding_size; i++)
+ {
+ ret = write(mtd_fd, &erase_value, sizeof(erase_value));
+ if (ret != sizeof(erase_value))
+ {
+ printf("%s:write data1 padding failed, ret=%d\n", __func__, ret);
+ goto test_fail;
+ }
+ }
+
/* power loss occurs after we write data */
ret = write(mtd_fd, key1, sizeof(key1));
@@ -718,9 +754,9 @@ static void test_nvs_corrupted_write(struct mtdnvs_ctx_s
*ctx)
/* set unused flash to 0xff */
- for (i = 2 * (sizeof(key1) + sizeof(wr_buf_1));
- i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 3 * 16;
- i++)
+ for (i = 2 * (sizeof(key1) + sizeof(wr_buf_1)) + padding_size;
+ i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - 3 * sizeof(struct nvs_ate); i++)
{
ret = write(mtd_fd, &erase_value, sizeof(erase_value));
if (ret != sizeof(erase_value))
@@ -830,9 +866,15 @@ static void test_nvs_gc(struct mtdnvs_ctx_s *ctx)
uint16_t id;
const uint16_t max_id = 10;
- /* 4096 * 2 / (44 + 4 + 16) = 128, 129 write will trigger GC. */
+ /* max_writes will trigger GC. */
+
+ size_t kv_size = NVS_ALIGN_UP(44 + 4) + sizeof(struct nvs_ate);
+ size_t block_max_write_size =
+ CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - sizeof(struct nvs_ate);
+ uint16_t block_max_write_nums = block_max_write_size / kv_size;
- const uint16_t max_writes = 129;
+ const uint16_t max_writes = block_max_write_nums + 1;
printf("%s: test begin\n", __func__);
@@ -1099,17 +1141,19 @@ test_fail:
static void test_nvs_gc_3sectors(struct mtdnvs_ctx_s *ctx)
{
int ret;
- const uint16_t max_id = 64;
-
- /* 4096 * 2 / (44 + 4 + 16) = 128, 129 write will trigger GC. */
- const uint16_t max_writes = 129;
+ /* max_writes will trigger GC */
- /* 4096 / (44 + 4 + 16) = 64, 129 + 64 write will trigger 2st GC. */
+ size_t kv_size = NVS_ALIGN_UP(44 + 4) + sizeof(struct nvs_ate);
+ size_t block_max_write_size =
+ CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - sizeof(struct nvs_ate);
+ uint16_t max_id = block_max_write_size / kv_size;
- const uint16_t max_writes_2 = 129 + 64;
- const uint16_t max_writes_3 = 129 + 64 + 64;
- const uint16_t max_writes_4 = 129 + 64 + 64 + 64;
+ const uint16_t max_writes = max_id + 1;
+ const uint16_t max_writes_2 = max_writes + max_id;
+ const uint16_t max_writes_3 = max_writes_2 + max_id;
+ const uint16_t max_writes_4 = max_writes_3 + max_id;
printf("%s: test begin\n", __func__);
@@ -1291,9 +1335,9 @@ test_fail:
static void test_nvs_corrupted_sector_close(struct mtdnvs_ctx_s *ctx)
{
int ret;
- uint8_t rd_buf[512];
- uint8_t wr_buf[512];
char key1[] = TEST_KEY1;
+ uint8_t rd_buf[NVS_ALIGN_UP(512) - sizeof(key1)];
+ uint8_t wr_buf[NVS_ALIGN_UP(512) - sizeof(key1)];
int mtd_fd = -1;
int nvs_fd = -1;
int loop_section;
@@ -1343,8 +1387,8 @@ static void test_nvs_corrupted_sector_close(struct
mtdnvs_ctx_s *ctx)
/* set unused flash to 0xff */
for (i = 2 * (sizeof(key1) + sizeof(wr_buf));
- i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 4 * 16;
- i++)
+ i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - 4 * sizeof(struct nvs_ate); i++)
{
ret = write(mtd_fd, &erase_value, sizeof(erase_value));
if (ret != sizeof(erase_value))
@@ -1394,7 +1438,8 @@ static void test_nvs_corrupted_sector_close(struct
mtdnvs_ctx_s *ctx)
else
{
fill_close_ate(ctx, &ate,
- CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 4 * 16);
+ CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - 4 * sizeof(struct nvs_ate));
}
ret = write(mtd_fd, &ate, sizeof(ate));
@@ -1690,8 +1735,8 @@ static void test_nvs_gc_corrupt_close_ate(struct
mtdnvs_ctx_s *ctx)
/* set unused flash to 0xff */
for (i = strlen(TEST_KEY1) + strlen(TEST_DATA1) + 2;
- i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 6 * 16;
- i++)
+ i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - 6 * sizeof(struct nvs_ate); i++)
{
ret = write(mtd_fd, &erase_value, sizeof(erase_value));
if (ret != sizeof(erase_value))
@@ -1713,9 +1758,10 @@ static void test_nvs_gc_corrupt_close_ate(struct
mtdnvs_ctx_s *ctx)
/* set unused flash to 0xff */
- for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 5 * 16;
- i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 2 * 16;
- i++)
+ for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - 5 * sizeof(struct nvs_ate);
+ i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - 2 * sizeof(struct nvs_ate); i++)
{
ret = write(mtd_fd, &erase_value, sizeof(erase_value));
if (ret != sizeof(erase_value))
@@ -1748,8 +1794,8 @@ static void test_nvs_gc_corrupt_close_ate(struct
mtdnvs_ctx_s *ctx)
/* set unused flash to 0xff in section 1 */
for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE;
- i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 16;
- i++)
+ i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - sizeof(struct nvs_ate); i++)
{
ret = write(mtd_fd, &erase_value, sizeof(erase_value));
if (ret != sizeof(erase_value))
@@ -1879,8 +1925,10 @@ static void test_nvs_gc_corrupt_ate(struct mtdnvs_ctx_s
*ctx)
goto test_fail;
}
- for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE / 2 + 16;
- i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 32; i++)
+ for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE / 2
+ + sizeof(struct nvs_ate);
+ i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - 2 * sizeof(struct nvs_ate); i++)
{
ret = write(mtd_fd, &erase_value, sizeof(erase_value));
if (ret != sizeof(erase_value))
@@ -1914,8 +1962,8 @@ static void test_nvs_gc_corrupt_ate(struct mtdnvs_ctx_s
*ctx)
/* set unused flash to 0xff in section 1 */
for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE;
- i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 16;
- i++)
+ i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
+ - sizeof(struct nvs_ate); i++)
{
ret = write(mtd_fd, &erase_value, sizeof(erase_value));
if (ret != sizeof(erase_value))
