On Thu, Jan 8, 2009 at 9:38 AM, Carl-Daniel Hailfinger
<[email protected]> wrote:
> Add erase and write functions to the following chip definitions:
>
> AT25DF021
> AT25DF041A
> AT25DF081
> AT25DF161
> AT25DF321
> AT25DF321A
> AT25DF641
> AT25F512B
> AT25FS010
> AT25FS040
> AT26DF081A
> AT26DF161
> AT26DF161A
> AT26DF321
> AT26F004
>
> Straight from the data sheets, untested because I lack the hardware.
>
> Signed-off-by: Carl-Daniel Hailfinger <[email protected]>

> @@ -179,7 +179,7 @@
>                .page_size      = 256,
>                .tested         = TEST_OK_PREW,
>                .probe          = probe_spi_rdid,
> -               .erase          = spi_chip_erase_c7,
> +               .erase          = spi_chip_erase_60_c7,

It's surprising to change this one since it was tested OK.  Shouldn't
you mark it TEST_UNTESTED now or TEST_OK_PRW?

Thanks,
Myles

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