At 23:21 2004-10-28 -0700, you wrote: > >EETimes 25 Oct 04 has an article about how >the testing structures on ICs makes them >vulnerable to attacks. The basic idea is >that to test a chip, you need to see inside >it; this can also reveal crypto details >(e.g., keys) which compromise the chip.
See EETimes Online: http://www.eetimes.com/showArticle.jhtml?articleID=51200146 and papers by Ramesh Karri at: http://cad.poly.edu/encryption/desscan_final.pdf http://cad.poly.edu/encryption/aesscan.pdf --Mark --------------------------------------------------------------------- The Cryptography Mailing List Unsubscribe by sending "unsubscribe cryptography" to [EMAIL PROTECTED]
