Danny Chen created FLINK-14705:
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Summary: Remove nullables argument of
BatchTestBase.registerCollection in blink planner
Key: FLINK-14705
URL: https://issues.apache.org/jira/browse/FLINK-14705
Project: Flink
Issue Type: Improvement
Reporter: Danny Chen
The register collection method use TypeInformation to register collections, the
type information does not have nullability attribute, we expect to use the new
DataType instead.
So for these test cases,
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