I'm hitting many OOMs because of this. Can we do this in a different way? It costs a lot of time when it fails because there is a "bad apple" test in TestIndexWriter that makes thousands of fields and blows up my console with megabytes of shit... we should pull that test out of TestIndexWriter.
On Wed, Sep 10, 2014 at 4:16 PM, <[email protected]> wrote: > Author: mikemccand > Date: Wed Sep 10 20:16:34 2014 > New Revision: 1624108 > > URL: http://svn.apache.org/r1624108 > Log: > improve test debuggability > > Modified: > > lucene/dev/trunk/lucene/core/src/test/org/apache/lucene/index/TestIndexWriter.java > > Modified: > lucene/dev/trunk/lucene/core/src/test/org/apache/lucene/index/TestIndexWriter.java > URL: > http://svn.apache.org/viewvc/lucene/dev/trunk/lucene/core/src/test/org/apache/lucene/index/TestIndexWriter.java?rev=1624108&r1=1624107&r2=1624108&view=diff > ============================================================================== > --- > lucene/dev/trunk/lucene/core/src/test/org/apache/lucene/index/TestIndexWriter.java > (original) > +++ > lucene/dev/trunk/lucene/core/src/test/org/apache/lucene/index/TestIndexWriter.java > Wed Sep 10 20:16:34 2014 > @@ -1087,6 +1087,7 @@ public class TestIndexWriter extends Luc > } > IndexWriterConfig conf = newIndexWriterConfig(random, > new > MockAnalyzer(random)).setMaxBufferedDocs(2); > + conf.setInfoStream(log); > w = new IndexWriter(dir, conf); > > Document doc = new Document(); > @@ -1102,6 +1103,7 @@ public class TestIndexWriter extends Luc > doc.add(sortedDVField); > doc.add(sortedSetDVField); > for(int i=0;i<100;i++) { > + log.println("\nTEST: i=" + i); > idField.setStringValue(Integer.toString(i)); > binaryDVField.setBytesValue(new > BytesRef(idField.stringValue())); > numericDVField.setLongValue(i); > > --------------------------------------------------------------------- To unsubscribe, e-mail: [email protected] For additional commands, e-mail: [email protected]
