[
https://issues.apache.org/jira/browse/MRUNIT-138?page=com.atlassian.jira.plugin.system.issuetabpanels:comment-tabpanel&focusedCommentId=13432181#comment-13432181
]
Dave Beech commented on MRUNIT-138:
-----------------------------------
Breaking backwards compatibility is a big issue, yes. But, I think we should be
promoting best practice. There's an argument that an individual unit test
should be completely isolated and sharing state between tests is very risky,
not something we should encourage.
> Multiple calls to withInput should be supported
> -----------------------------------------------
>
> Key: MRUNIT-138
> URL: https://issues.apache.org/jira/browse/MRUNIT-138
> Project: MRUnit
> Issue Type: Improvement
> Affects Versions: 1.0.0
> Reporter: Dave Beech
>
> As multiple key/val pairs are now supported for tests following MRUNIT-64, it
> feels to me that I should be able to call withInput multiple times in
> sequence in the same way I would usually call withOutput. This doesn't work
> because of the way the deprecation of the old code has been handled.
> Here's a unit test I think should pass:
> (from TestMapDriver - mapper is IdentityMapper)
> @Test
> public void testMultipleWithInput() throws IOException {
> driver.withInput(new Text("foo"), new Text("bar"))
> .withInput(new Text("bar"), new Text("baz"))
> .withOutput(new Text("foo"), new Text("bar"))
> .withOutput(new Text("bar"), new Text("baz"))
> .runTest(false);
> }
--
This message is automatically generated by JIRA.
If you think it was sent incorrectly, please contact your JIRA administrators:
https://issues.apache.org/jira/secure/ContactAdministrators!default.jspa
For more information on JIRA, see: http://www.atlassian.com/software/jira