Hi All, Thought some of you would enjoy this month's Technical Tidbit at http://www.dsmith.org. It describes a method of measuring the effect of external EMI (electromagnetic interference) on the internal circuits of electronic equipment. Often thought to be a difficult job, many times it can be done with simple techniques if attention is paid to the technical details of the measurement. Data is presented for one such measurement.
Also added to the site this month: - ESD Symposium paper titled "ESD Immunity in System Designs, System Field Experiences and Effects of PWB Layout" under the "Technical Information and Downloads" heading. - Pictures of Cambridge, MA, USA, site of the recent IEC TC77B (high frequency immunity) committee meeting under the "Miscellaneous" heading near the Zug and Veldhoven picture links. Doug To unsubscribe from this list send email to [email protected] and put "unsubscribe HF News" in the subject line. -- ------------------------------------------------------- ___ _ Doug Smith \ / ) P.O. Box 1457 ========= Los Gatos, CA 95031-1457 _ / \ / \ _ TEL/FAX: 408-356-4186/358-3799 / /\ \ ] / /\ \ Mobile: 408-858-4528 | q-----( ) | o | Email: [email protected] \ _ / ] \ _ / Website: http://www.dsmith.org ------------------------------------------------------- **** To unsubscribe from si-list or si-list-digest: send e-mail to [email protected]. In the BODY of message put: UNSUBSCRIBE si-list or UNSUBSCRIBE si-list-digest, for more help, put HELP. si-list archives are accessible at http://www.qsl.net/wb6tpu ****
