Hi All,
The EOS/ESD (electrical overstress/electrostatic discharge)
Symposium was last week in Anaheim, CA, USA. I focused on
the system level effects of ESD, as a source of EMI, as
opposed to controlling static charge. 18 representative
pictures are now posted at www.dsmith.org under
"Miscellaneous" next to the pictures of Veldhoven and Zug.
Some of the pictures show useful and novel measuring
instruments related to the EMI potential of ESD and other
sources from companies like Barth and Credence as well as
others. If you want to "grab" a picture, just right click
(on a PC running Windows) the picture and enter the location
where you want it to be stored on your machine. Links to the
websites of the companies whose equipment is shown are also
included in many cases.
The Technical Tidbit for October relates to high frequency
design of resistors for measurement or incorporation into
designs. An example of a resistor from Barth Electronics is
discussed. This is the design Barth uses in his DC to ~20GHz
T-Pad that is described in an earlier Technical Tidbit
titled "Tapered Wall Cavity" that I posted to the site
exactly one year ago. The picture was taken at the Barth
booth.
Doug
--
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___ _ Doug Smith
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