Meeting notice for TUESDAY, October 9th at SGI in Mountain View. Social begins at 5:30pm and presentation at 7:00pm
Please visit our website for full details including map. www.scvemc.org EFT Testing and Common Pitfalls, Meeting Notice, Santa Clara Valley EMC Society Chapter By: Doug Smith Details: - Doug Smith, will cover the background of EFT testing (IEC 61000- 4- 4) w along with common pitfalls. Doug will also share some tips on the testing process. Doug believes that all talks should have some entertainment value and this talk is not an exception. War stories and demonstrations will be used throughout the talk. One of these covers a common mistake that some testing labs make that can nearly double the stress on the EUT. If you have an EFT Burst Generator what do you do with it when it is not being used (probably most of the time unless you work for a test lab)? Doug will cover some test / debug techniques using an EFT generator that have nothing to do with EFT, such as solving ESD problems and measuring noise margins at the PWB and circuit trace level. Mr. Smith held an FCC First Class Radiotelephone license by age 16 and a General Class amateur radio license at age 12. He received a B.E.E.E. degree from Vanderbilt University in 1969 and an M.S.E.E. degree from the California Institute of Technology in 1970. In 1970, he joined AT&T Bell Laboratories as a Member of Technical Staff. He retired in 1996 as a Distinguished Member of Technical Staff. >From February 1996 to April 2000 he was Manager of EMC Development and Test at Auspex Systems in Santa Clara, CA. Mr. Smith currently is an independent consultant specializing in high frequency measurements, circuit/system design and verification, switching power supply noise and specifications, EMC, and immunity to transient noise. He is a Senior Member of the IEEE and a member of the IEEE EMC Society Board of Directors. His technical interests include high frequency effects in electronic circuits, including topics such as Electromagnetic Compatibility (EMC), Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), and other forms of pulsed electromagnetic interference. He also has been involved with FCC Part 68 testing and design, telephone system analog and digital design, IC design, and computer simulation of circuits. He has been granted over 15 patents, several on measurement apparatus. Mr. Smith has lectured at Vanderbilt University, AT&T Bell Labs, and at many public and private seminars on high frequency measurements, circuit design, ESD, and EMC. He is author of the book High Frequency Measurements and Noise in Electronic Circuits and is currently working on his second book. ===== Best Regards Hans Mellberg Regulatory Compliance & EMC Design Services Consultant By the Pacific Coast next to Silicon Valley, Santa Cruz, CA, USA 408-507-9694 __________________________________________________ Do You Yahoo!? NEW from Yahoo! GeoCities - quick and easy web site hosting, just $8.95/month. http://geocities.yahoo.com/ps/info1 ------------------------------------------- This message is from the IEEE EMC Society Product Safety Technical Committee emc-pstc discussion list. Visit our web site at: http://www.ewh.ieee.org/soc/emcs/pstc/ To cancel your subscription, send mail to: [email protected] with the single line: unsubscribe emc-pstc For help, send mail to the list administrators: Michael Garretson: [email protected] Dave Heald [email protected] For policy questions, send mail to: Richard Nute: [email protected] Jim Bacher: [email protected] All emc-pstc postings are archived and searchable on the web at: No longer online until our new server is brought online and the old messages are imported into the new server.
