Have the chart in front of me and still making no sense out of it.
Table 3 Test specification T 3.1E calls out some test points and a
dwell time along with the reference to IEC 68-2-1, -2, -14 and -56. Under the
method column it then says that the method in Annex b can be used.
In Annex B there is a Table B.1 that has numerous set points that don't
match up well, in my reading, with the first table. Heavy Sigh! Still I can
build the profile if I just knew the dwell times at each spot. Can anybody help
me out - I don't really want to have to by multiple IEC standards, I'd rather
be able to buy food for the week.
Final question. They give rate changes when temperature is held
constant and when humidity is held constant, but in some instances they change
both simultaneously. Usually the change in temperature takes longer than the
change in humidity - but what's a poor kid from Spokane suppose to do? First
ramp the humidity holding temp the same, and then change the temp while holding
the new humidity level constant?
Thanks
Gary
-------------------------------------------
This message is from the IEEE EMC Society Product Safety
Technical Committee emc-pstc discussion list.
Visit our web site at: http://www.ewh.ieee.org/soc/emcs/pstc/
To cancel your subscription, send mail to:
majord...@ieee.org
with the single line:
unsubscribe emc-pstc
For help, send mail to the list administrators:
Ron Pickard: emc-p...@hypercom.com
Dave Heald: davehe...@attbi.com
For policy questions, send mail to:
Richard Nute: ri...@ieee.org
Jim Bacher: j.bac...@ieee.org
All emc-pstc postings are archived and searchable on the web at:
http://ieeepstc.mindcruiser.com/
Click on "browse" and then "emc-pstc mailing list"
