[email protected] wrote (in <OFB02BEC92.AFF10067-ON85256FFC.00474854-85256FFC.004907C3@US.Schneider-E lectric.com>) about 'ESD HBM contact pad to pad testing.', on Mon, 9 May 2005: >Take a look at industry standards. As I remember from my years I spent >in the semiconductor industry, JEDEC standards were among those used to >evaluate chips.
What about: IEC/PAS 62162 (2000-08) English Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components and this one is not yet published, but maybe someone will provide a copy privately: IEC 60749-26 Ed. 2.0 CCDV 47/1803/CDV 05-03 05-09 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing Human body model (HBM) Note that the First Edition has already been published. -- Regards, John Woodgate, OOO - Own Opinions Only. There are two sides to every question, except 'What is a Moebius strip?' http://www.jmwa.demon.co.uk Also see http://www.isce.org.uk This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. Website: http://www.ieee-pses.org/ To post a message to the list, send your e-mail to [email protected] Instructions: http://listserv.ieee.org/listserv/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas [email protected] Mike Cantwell [email protected] For policy questions, send mail to: Richard Nute: [email protected] Jim Bacher: [email protected] All emc-pstc postings are archived and searchable on the web at: http://www.ieeecommunities.org/emc-pstc
