CF, SD, Micro SD etc Associations comply with the association standards. The Physical damages to cards are common, But the stored data is never lost. Companies have recovered the data even from the broken (physically) cards.
Sudhakar From: [email protected] [mailto:[email protected]] On Behalf Of Kevin Chu Sent: Wednesday, August 03, 2005 10:38 AM To: [email protected] Subject: RE: Test Issues for ITE Shipped with Data The article referenced below indicates that it is the "CompactFlash Association" that has reported the damage. I don't know whether or not the vulnerability is caused by improper manufacturer implementation of the flash. Kevin From: Sudhakar Wasnik [mailto:[email protected]] Sent: August 3, 2005 10:32 AM To: Kevin Chu; [email protected] Subject: RE: Test Issues for ITE Shipped with Data The storage devices like CF, SD, Cruzers etc (Based on the Flash Technology) are evaluated to X ray radiation, Gamma Radiation and Solar Radiation. This technology is proven and it conforms to several JEDEC standards. Sudhakar From: [email protected] [mailto:[email protected]] On Behalf Of Kevin Chu Sent: Wednesday, August 03, 2005 10:15 AM To: [email protected] Subject: RE: Test Issues for ITE Shipped with Data The USPS Anthrax procedure is known to damage compact-flash cards, pharmaceuticals, contact lenses, biological samples, and photographic film. http://www.dpreview.com/news/0201/02010803mailcleaningzap.asp Kevin From: [email protected] [mailto:[email protected]] On Behalf Of Monsen, Monrad L Sent: August 3, 2005 9:11 AM To: [email protected] Subject: Test Issues for ITE Shipped with Data What are some of the ElectroMagnetic Compatibility (EMC) environments that a product will experience in shipping either by FEDEX/UPS/USPS or by air transport? Are there any EMC immunity standards suggested for shipping? We all know that all suitcases and carry-on bags are inspected by X-ray machines. Who can test this type of X-ray immunity? Are there any test standards for this type of immunity testing? In addition, irradiation (electron beams, etc.) is used on our mail to kill biological matter like Anthrax. Could this do anything to electronics or stored information (tape, disk, CMOS, PROM, ROM, etc.)? Are there any immunity tests appropriate for this? Are there any papers on what types of devices might be impacted or susceptible to X-rays, electron beams, or other environmental stresses that could be experienced in shipping? Also, what radio frequencies and field strength levels are experienced by bags and boxes shipped by air? An airport is riddled with many RF noise-makers like security radios, cell phone repeaters, control tower radios and radars. I begin to wonder if the European Union test level of 3V/m is really adequate. We test 10V/m to cover the field strengths that can be experienced even in computer room floors, but I am wondering if there are any studies out on what the real RF environment is during shipping. Thank you. Monrad L. Monsen Senior Compliance Project Manager Product Compliance Test 303.673.2438 phone 303.673.2431 fax [email protected] StorageTek This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. Website: http://www.ieee-pses.org/ To post a message to the list, send your e-mail to [email protected] Instructions: http://listserv.ieee.org/listserv/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas [email protected] Mike Cantwell [email protected] For policy questions, send mail to: Richard Nute: [email protected] Jim Bacher: [email protected] All emc-pstc postings are archived and searchable on the web at: http://www.ieeecommunities.org/emc-pstc This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. Website: http://www.ieee-pses.org/ To post a message to the list, send your e-mail to [email protected] Instructions: http://listserv.ieee.org/listserv/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas [email protected] Mike Cantwell [email protected] For policy questions, send mail to: Richard Nute: [email protected] Jim Bacher: [email protected] All emc-pstc postings are archived and searchable on the web at: http://www.ieeecommunities.org/emc-pstc This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. Website: http://www.ieee-pses.org/ To post a message to the list, send your e-mail to [email protected] Instructions: http://listserv.ieee.org/listserv/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas [email protected] Mike Cantwell [email protected] For policy questions, send mail to: Richard Nute: [email protected] Jim Bacher: [email protected] All emc-pstc postings are archived and searchable on the web at: http://www.ieeecommunities.org/emc-pstc This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. Website: http://www.ieee-pses.org/ To post a message to the list, send your e-mail to [email protected] Instructions: http://listserv.ieee.org/listserv/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas [email protected] Mike Cantwell [email protected] For policy questions, send mail to: Richard Nute: [email protected] Jim Bacher: [email protected] All emc-pstc postings are archived and searchable on the web at: http://www.ieeecommunities.org/emc-pstc
