Please below see the announcement for the upcoming meeting of IEEE-EMCS Santa Clara Valley Chapter on Feb. 13, 2007. Regards, Oscar Fallah Treasurer, IEEE-EMCS SCV Chapter _____
Please visit <http://www.scvemc.org/> http://www.scvemc.org/ for February's chapter newsletter (the Spectral Lines). IEEE/EMC Society Meeting Tuesday February 13, 2007 Time: Social 5:30 p.m. Presentation 6:30 p.m. Place: Applied Materials Bowers Cafeteria 3090 Bowers Ave., Santa Clara, CA 95051-0804 Subject: Taking the guesswork out of EMC design using numerical simulations Speaker: Federico P. Centola, Flomerics Inc. Speaker Bio: Federico Pio Centola received his Laureate degree in electrical engineering >from the University of L'Aquila, Italy in 2001 and the M.S. degree in electrical engineering from the University of Missouri Rolla in 2003. From 2001 to 2003 he has been with the Electromagnetic Compatibility Laboratory at the University of Missouri Rolla where he was a visiting scholar and a graduate research assistant. His research interests included numerical simulations, electrostatic discharge and shielding. He has been an EMC instructor and consultant for Flomerics Inc. where he specialized in applying numerical simulations to solve EMC problems. He is currently working for Flomerics as an Electromagnetic Applications Engineer. Abstract: Numerical simulations for EMC applications have been proven to be very cost effective when comparing different design options. Different EMC design practices such as minimizing coupling paths, shielding, grounding practices and filtering can be effectively evaluated using numerical simulations. In most EMC applications the geometry and the complexity of the problem needs to be highly simplified in order to achieve a model that can be computed within a reasonable amount of time and memory. In this talk, this simplification process will be shown using models of common real-world EMC applications. The simulation results will then be compared to measurements to validate the process. The examples presented will show how the visualization of EM fields and currents allows engineers to have an insight of the system, to suggest design alternatives and to quantify in advance the effectiveness of each different solution. - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. Website: http://www.ieee-pses.org/ To post a message to the list, send your e-mail to [email protected] Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas [email protected] Mike Cantwell [email protected] For policy questions, send mail to: Jim Bacher: [email protected] David Heald: [email protected] All emc-pstc postings are archived and searchable on the web at: http://www.ieeecommunities.org/emc-pstc ______________________________________________________________________ This email has been scanned by the MessageLabs Email Security System. For more information please visit http://www.messagelabs.com/email ______________________________________________________________________
