Possibly what the authors where trying to describe, but didn't want to write "100:1 scope probe" _______________________________________ _____________________________________________
Ralph McDiarmid | Schneider Electric | Renewable Energies Business | CANADA | Regulatory Engineer From: John Woodgate <[email protected]> To: [email protected] List-Post: [email protected] Date: 05/11/2011 12:34 PM Subject: Re: [PSES] UL/60950-1 Cl. 2.1.1.7 Probe ________________________________ In message <DD4909DB1F9A2346A6EE5A2D723D0B3218A0EEAFD4@P3PW5EX1MB13.EX1.SECURESERVER .NET>, dated Wed, 11 May 2011, "[email protected]" <[email protected]> writes: > >All, > > > >If anyone has a source for the probe 100 Mohm +/- 5 Mohm in parallel >with input capacitance of 20 pF +/- 5 pF please forward. > > The IEC standard says: When conducting the voltage decay measurement, the measurement is either made with, or referred to, an instrument having an input impedance consisting of a resistance of 100 Mohms ± 5 Mohms in parallel with an input capacitance of 25 pF or less. So any 100: 1 probe can probably be used. I would expect the capacitance of a 100:1 probe to be much less than 15 pF, so just add extra shunt capacitance to taste. -- OOO - Own Opinions Only. Try www.jmwa.demon.co.uk and www.isce.org.uk John Woodgate, J M Woodgate and Associates, Rayleigh, Essex UK Plural: data, criteria, phenomena. Singular: datum (different meaning: use 'data element' for a single item), criterion, phenomenon. 'Effect' is a noun, 'affect' is a verb (except in psychiatry). - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <[email protected]> All emc-pstc postings are archived and searchable on the web at: http://product-compliance.oc.ieee.org/ http://product-compliance.oc.ieee.org/> Graphics (in well-used formats), large files, etc. can be posted to that URL. Website: http://www.ieee-pses.org/ <http://www.ieee-pses.org/> Instructions: http://listserv.ieee.org/request/user-guide.html <http://listserv.ieee.org/request/user-guide.html> List rules: http://www.ieee-pses.org/listrules.html <http://www.ieee-pses.org/listrules.html> For help, send mail to the list administrators: Scott Douglas <[email protected]> Mike Cantwell <[email protected]> For policy questions, send mail to: Jim Bacher: <[email protected]> David Heald: <[email protected]> ______________________________________________________________________ This email has been scanned by the MessageLabs Email Security System. ______________________________________________________________________ - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <[email protected]> All emc-pstc postings are archived and searchable on the web at http://product-compliance.oc.ieee.org/ Graphics (in well-used formats), large files, etc. can be posted to that URL. Website: http://www.ieee-pses.org/ Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <[email protected]> Mike Cantwell <[email protected]> For policy questions, send mail to: Jim Bacher <[email protected]> David Heald <[email protected]>
