Bill Keep 8.4 and 8.5 separate - they are measuring 2 different things:
The -46 dBm that is part of the spectral mask ion 8.4 is obtained with an Averaging detector. When measuring Spurious emissions, perform a "pre-scan" using the stated BW and run measurement up to the Band Edge: - if you pass the Spurious Emissions limit at band edge, great. - if you don't pass the limit, you need to measure the power in the "Bandwidth" immediately adjacent to the Band Edge. You can do this by using a lower BW and summing the power over the required bandwidth - the "Channel power" facility on your receiver will do this for you if you centre it BW/2 above or below the band edge. This test method isn't cited for this particular clause, but is referenced in Step 10 of 10.2.2 and used when testing other types of device. Regards Charlie -----Original Message----- From: Bill Owsley [mailto:[email protected]] Sent: 01 February 2011 16:01 To: 'Bill Owsley'; [email protected]; Charlie Blackham Subject: RE: [PSES] EN 302 208-1, v1.3.1 Ok. So the next question refers to 8.5.1, the definition. "Spurious emissions are emissions at frequencies other than those of the wanted carrier frequency and its sidebands associated with normal test modulation." And two questions mixed together. - modulation sidebands outside of the +/- 500 kHz band - RBW over lapping into the excluded +/- 500 kHz band. Using 6.6 settings, and assuming that the instrument centers the RBW window on the frequency just outside of the band edge, half of the RBW is receiving signals from the modulation sidebands from inside the excluded band. The limit inside the band is -46 dBm and outside the band it is -36 dBm. However the difference in the measuring RBW, inside to outside the band, 1 kHz to 100 kHz, is 20 dB. Thus there would need to be a 10 dB margin just inside the band edge in order to pass just outside the band edge, due to the change in RBW. Or, the measuring frequency near the band edge could be moved just enough to account for half of the RBW, so that the measured energy is not from inside the band. Or, the modulation sideband emissions outside of the defined band can be ignored. Thoughts ??? - Bill Attitude is Mind over Matter. If you don't Mind, it doesn't Matter... This email has been displayed using 100% recycled electrons and 100% pure virgin photons. --- On Tue, 2/1/11, Charlie Blackham <[email protected]> wrote: > From: Charlie Blackham <[email protected]> > Subject: RE: [PSES] EN 302 208-1, v1.3.1 > To: "'Bill Owsley'" <[email protected]>, [email protected] > Date: Tuesday, February 1, 2011, 4:21 AM > Bill > > 8.4.2 gives Receiver settings to measure Spectral > Mask - these are > applicable only to Spectral Mask and shouldn't be used for > Spurious > Emissions. > > Section 8.5.2 is poorly worded, but I read it as follows: > > 8.5.2.1 is Conducted Spurious Emissions and RBW/VBW are set > as per Clause > 6.6 (step 2) > > 8.5.2.2, Radiated Spurious Emissions, step 5 references > Table 2 (which is > Clause 6.6). > > (Note: exact tests required depends on whether antenna is > integrated or not > as per opening para of section 8.5.2) > > Regards > Charlie > > > -----Original Message----- > From: Bill Owsley [mailto:[email protected]] > > Sent: 31 January 2011 19:27 > To: [email protected] > Subject: [PSES] EN 302 208-1, v1.3.1 > > Calling all Radio experts... > > Section 8.4.2, Method of Measurement, > step 3 defines equipment settings. > > Now go to 8.5.2.1, Method of measuring into a specified > load. > Not much different from the above 8.4.2, but... > no step defining equipment settings. > But in 8.5.2.2, radiated, it does define the settings. > > Considering that 8.4.2 has a definition, can that be > carried over to 8.5.2.1 > for those measurement since they are both conducted into > specified loads? > Where the next section, 8.5.2.2, is radiated measurement. > > Thanks, > - Bill > > > Attitude is Mind over Matter. > If you don't Mind, it doesn't Matter... > This email has been displayed using 100% recycled electrons > and 100% pure > virgin photons. > > > > > > - > ---------------------------------------------------------------- > This message is from the IEEE Product Safety Engineering > Society emc-pstc > discussion list. To post a message to the list, send your > e-mail to > <[email protected]> > > All emc-pstc postings are archived and searchable on the > web at: > http://product-compliance.oc.ieee.org/ > Graphics (in well-used formats), large files, etc. can be > posted to that > URL. > > Website: http://www.ieee-pses.org/ > Instructions: http://listserv.ieee.org/request/user-guide.html > List rules: http://www.ieee-pses.org/listrules.html > > For help, send mail to the list administrators: > Scott Douglas <[email protected]> > Mike Cantwell <[email protected]> > > For policy questions, send mail to: > Jim Bacher: <[email protected]> > David Heald: <[email protected]> > > - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <[email protected]> All emc-pstc postings are archived and searchable on the web at: http://product-compliance.oc.ieee.org/ Graphics (in well-used formats), large files, etc. can be posted to that URL. Website: http://www.ieee-pses.org/ Instructions: http://listserv.ieee.org/request/user-guide.html List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <[email protected]> Mike Cantwell <[email protected]> For policy questions, send mail to: Jim Bacher: <[email protected]> David Heald: <[email protected]>
