My experience suggests that manufacturing ATP may not always be
realistic; I may have mentioned seeing one ATP set that used DC to test
for presence and gain of direct-coupled video amplifiers. This becomes
even more a problem for EMC when a manager budgets for ATP as the host
during EMC testing, because EMC of the test set is probably a distant
second to the fact that it's already paid for, and if we use the DC
test, we aren't testing properly to 461 and DO-160, etc. .
That said, when I had to get hands-on with one vendor's product, our
customer wanted a written procedure to insure I/O transient protection
was still there and working, and a current-limited DC bench test was OK
for that. It won't, however, check distributed protection, where only
the highest levels are accesible from outside the UUT.
Cortland Richmond
-
----------------------------------------------------------------
This message is from the IEEE Product Safety Engineering Society emc-pstc discussion
list. To post a message to the list, send your e-mail to <[email protected]>
All emc-pstc postings are archived and searchable on the web at:
http://www.ieee-pses.org/emc-pstc.html
Attachments are not permitted but the IEEE PSES Online Communities site at
http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used
formats), large files, etc.
Website: http://www.ieee-pses.org/
Instructions: http://www.ieee-pses.org/list.html (including how to unsubscribe)
List rules: http://www.ieee-pses.org/listrules.html
For help, send mail to the list administrators:
Scott Douglas <[email protected]>
Mike Cantwell <[email protected]>
For policy questions, send mail to:
Jim Bacher: <[email protected]>
David Heald: <[email protected]>
