It may be helpful to determine which components are likely to be the failure 
points. Various materials and components age quite differently with differences 
in temperature.

For examples, IEC 60950-1 does give a rough ageing test for adhesives used for 
constructional purposes in section 4.6.5. Adhesives are preconditioned for 
eight weeks at 82 C, three weeks at 90 C or one week at 100 C. Fixed 
temperature and humidity cycling is performed after the temperature soak. 
Somebody seems to think that adhesives age three times as fast for every 10 
degree increase in temperature.

Lithium-ion batteries can exhibit an even greater decrease in life with 
increases in temperature. Storing fully charged lithium-ion batteries at 
elevated temperatures can significantly affect their capacity and operating 
life.
http://batteryuniversity.com/learn/article/how_to_prolong_lithium_based_batteries

On the other hand, if the failure mode involves stress fractures or is related 
to the brittleness of materials, increases in temperature may forestall 
failures.

I seem to recall that the first time I heard that increasing temperature by 10 
degrees cut product life in half was related to semiconductors. However, even 
here, the situation isn't quite that simple. The following article from 
Intersil gives a more rigorous mathematical analysis.
http://rel.intersil.com/docs/rel/calculation_of_semiconductor_failure_rates.pdf

Ted Eckert
Compliance Engineer
Microsoft Corporation
[email protected]<mailto:[email protected]>

The opinions expressed are my own and do not necessarily reflect those of my 
employer.

From: Gary McInturff [mailto:[email protected]]
Sent: Monday, October 20, 2014 10:00 AM
To: [email protected]
Subject: Re: [PSES] Reliability

John you're going to be wrong no matter what you do - depending on who you are 
talking to. The 10 degree rise = twice the failure estimation is based on the 
Arrhenius model - which is actually a chemical model, but widely applied to 
electronics  So as a rule of thumb you can state you acceleration factor is 
based on that - assuming that you product is displaying a normal (Gaussian) 
random mode failure mechanism and not infant or wear-out modes.

The more proper way of finding the actual acceleration rate - for temperature 
or anything else is to run life tests at low, normal and high temperatures and 
correlating the failure times - but I'm guessing you (and most people) don't 
have the time or resources to do that so prediction is the only real tool you 
have - unless you have an ongoing reliability growth mechanism, which might be 
in-house testing or working with the field data failures and making 
adjustments. Getting good field failure data is a real problem on its own.

Sample size is going to be a real problem to John. If you have one sample does 
that represent the whole population, or did you get the one unit that was in 
the 10th percentile or maybe the 90th percentile. Another rule of thumb is that 
you need 25 - 30 samples to get a better feeling for the full population size 
not just the test size.

I would work with your customer (engineering staff or external customer) and 
seek agreement that he accepts the acceleration factor and the sample size.

This is a much bigger problem than you may realize but if you can't test many 
samples for many hours then you have to start somewhere and state your 
assumptions.
A good primer of the subject (although it doesn't do into acceleration factors 
is Reliability Statistics by Robert A. Dovich ISBN 0-87389-086 (at least that's 
the number on my version - could be newer editions)

This is a big and ugly specialty John. But as a starting point, after agreement 
with your customer, running the unit(s) at a higher temperature and assuming 
the 10c doubles the failure rate is at least a starting point.









Gmac

From: [email protected]<mailto:[email protected]> 
[mailto:[email protected]]
Sent: Monday, October 20, 2014 6:38 AM
To: [email protected]<mailto:[email protected]>
Subject: [PSES] Reliability

Hi,

Any reliability engineers out there?

Based on every 10° rise reduces life by half, and if I call 1 year at 22C my 
baseline, conditioning at 62C for 3.25 weeks will equal 1 year.  Does 
conditioning at 62C for 6.5 weeks equal 2 years?

Thanks,

John


-
----------------------------------------------------------------

This message is from the IEEE Product Safety Engineering Society emc-pstc 
discussion list. To post a message to the list, send your e-mail to 
<[email protected]<mailto:[email protected]>>

All emc-pstc postings are archived and searchable on the web at: 
http://www.ieee-pses.org/emc-pstc.html<https://urldefense.proofpoint.com/v2/url?u=http-3A__www.ieee-2Dpses.org_emc-2Dpstc.html&d=AAMFAw&c=0hKVUfnuoBozYN8UvxPA-w&r=RJLDFgHJo89sjFN46b74hFXEuxvz4Z1iAx-glaOgP0k&m=mutoSjhbOVGNPlqXwnSZ5e4AYSf_N3T--cRZ8Ni24sM&s=Fp19GPr800KCYDmSMF8TnCGWvPm7XENUM6vZleN0yY8&e=>

Attachments are not permitted but the IEEE PSES Online Communities site at 
http://product-compliance.oc.ieee.org/<https://urldefense.proofpoint.com/v2/url?u=http-3A__product-2Dcompliance.oc.ieee.org_&d=AAMFAw&c=0hKVUfnuoBozYN8UvxPA-w&r=RJLDFgHJo89sjFN46b74hFXEuxvz4Z1iAx-glaOgP0k&m=mutoSjhbOVGNPlqXwnSZ5e4AYSf_N3T--cRZ8Ni24sM&s=3VLirc4rYVE3CnT9uBQ9fCJIv7dw8Jc7YJsggqofxV8&e=>
 can be used for graphics (in well-used formats), large files, etc.

Website: 
http://www.ieee-pses.org/<https://urldefense.proofpoint.com/v2/url?u=http-3A__www.ieee-2Dpses.org_&d=AAMFAw&c=0hKVUfnuoBozYN8UvxPA-w&r=RJLDFgHJo89sjFN46b74hFXEuxvz4Z1iAx-glaOgP0k&m=mutoSjhbOVGNPlqXwnSZ5e4AYSf_N3T--cRZ8Ni24sM&s=MObVJcCeSAR_1KgfPG7lfO3lu1paPYYW7rsonPE64a4&e=>
Instructions: http://www.ieee-pses.org/list.html (including how to 
unsubscribe)<https://urldefense.proofpoint.com/v2/url?u=http-3A__www.ieee-2Dpses.org_list.html&d=AAMFAw&c=0hKVUfnuoBozYN8UvxPA-w&r=RJLDFgHJo89sjFN46b74hFXEuxvz4Z1iAx-glaOgP0k&m=mutoSjhbOVGNPlqXwnSZ5e4AYSf_N3T--cRZ8Ni24sM&s=4JsWjoHODVx-ccqrncnbWdiXGiC-7RUNyy2JFb4IUKI&e=>
List rules: 
http://www.ieee-pses.org/listrules.html<https://urldefense.proofpoint.com/v2/url?u=http-3A__www.ieee-2Dpses.org_listrules.html&d=AAMFAw&c=0hKVUfnuoBozYN8UvxPA-w&r=RJLDFgHJo89sjFN46b74hFXEuxvz4Z1iAx-glaOgP0k&m=mutoSjhbOVGNPlqXwnSZ5e4AYSf_N3T--cRZ8Ni24sM&s=9CcjclBPH723_4JHHM58cCzD6Ktt7t9Zd4rbVpPqOKk&e=>

For help, send mail to the list administrators:
Scott Douglas <[email protected]<mailto:[email protected]>>
Mike Cantwell <[email protected]<mailto:[email protected]>>

For policy questions, send mail to:
Jim Bacher <[email protected]<mailto:[email protected]>>
David Heald <[email protected]<mailto:[email protected]>>
-
----------------------------------------------------------------

This message is from the IEEE Product Safety Engineering Society emc-pstc 
discussion list. To post a message to the list, send your e-mail to 
<[email protected]<mailto:[email protected]>>

All emc-pstc postings are archived and searchable on the web at: 
http://www.ieee-pses.org/emc-pstc.html

Attachments are not permitted but the IEEE PSES Online Communities site at 
http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used 
formats), large files, etc.

Website: http://www.ieee-pses.org/
Instructions: http://www.ieee-pses.org/list.html (including how to 
unsubscribe)<http://www.ieee-pses.org/list.html>
List rules: http://www.ieee-pses.org/listrules.html

For help, send mail to the list administrators:
Scott Douglas <[email protected]<mailto:[email protected]>>
Mike Cantwell <[email protected]<mailto:[email protected]>>

For policy questions, send mail to:
Jim Bacher <[email protected]<mailto:[email protected]>>
David Heald <[email protected]<mailto:[email protected]>>

-
----------------------------------------------------------------
This message is from the IEEE Product Safety Engineering Society emc-pstc 
discussion list. To post a message to the list, send your e-mail to 
<[email protected]>

All emc-pstc postings are archived and searchable on the web at:
http://www.ieee-pses.org/emc-pstc.html

Attachments are not permitted but the IEEE PSES Online Communities site at 
http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used 
formats), large files, etc.

Website:  http://www.ieee-pses.org/
Instructions:  http://www.ieee-pses.org/list.html (including how to unsubscribe)
List rules: http://www.ieee-pses.org/listrules.html

For help, send mail to the list administrators:
Scott Douglas <[email protected]>
Mike Cantwell <[email protected]>

For policy questions, send mail to:
Jim Bacher:  <[email protected]>
David Heald: <[email protected]>

Reply via email to