Hi, Charles,

Would you be able to share a bit more context?  Are you interested in a
basic distribution of discharge event vs. voltage (lots of parameters which
affect this)?  Catastrophic or latent failures or both?  Particular classes
of devices/systems/environments?  Detectable by a human or down at the
threshold of laser diodes and a few other types of devices?

Depending on what is of most interest, there might be different information
sources (experts like Dr. Pommerenke, Doug Smith and others, the EOS/ESD
Association, some journal papers and masters/PhD theses, etc.).


Interested to know more.


Cheers,
Adam in Atlanta
[email protected]





On Wed, Aug 8, 2018 at 6:16 PM, Grasso, Charles <[email protected]>
wrote:

> Hello,
>
>
>
> I have been (fruitlessly) hunting down any reference to the above
> subject.
>
>
>
> Does anyone know of such a reference?
>
>
>
>
>
> Thanks
>
>
>
> Charles Grasso
>
> (w) 303-706-5467
>
>
> -
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