Hello all, Well the good news is that I have found the paper I was looking for. The bad news is that : I have found the paper I was looking for.
The paper is about the statistical nature of ESD but is focused on determining an MTBUR (Mean Time Between Undesired Responses) rating for the EUT. Assumptions are made (to demonstrate the process) regarding frequency of occurrence and levels. This clearly shows the dependency on location. For those folks interested the title is: “Impact of Time and Voltage Windows on ESD testing” by Franz Gisin and TJ Ritenour. Thanks Charles Grasso (w) 303-706-5467 From: Adam Dixon [mailto:[email protected]] Sent: Wednesday, August 08, 2018 7:40 PM To: Grasso, Charles <[email protected]> Cc: [email protected] Subject: Re: [PSES] Frequency of Occurrence of ESD with respect to Voltage This message originated outside of DISH and was sent by: [email protected]<mailto:[email protected]> Hi, Charles, Would you be able to share a bit more context? Are you interested in a basic distribution of discharge event vs. voltage (lots of parameters which affect this)? Catastrophic or latent failures or both? Particular classes of devices/systems/environments? Detectable by a human or down at the threshold of laser diodes and a few other types of devices? Depending on what is of most interest, there might be different information sources (experts like Dr. Pommerenke, Doug Smith and others, the EOS/ESD Association, some journal papers and masters/PhD theses, etc.). Interested to know more. Cheers, Adam in Atlanta [email protected]<mailto:[email protected]> On Wed, Aug 8, 2018 at 6:16 PM, Grasso, Charles <[email protected]<mailto:[email protected]>> wrote: Hello, I have been (fruitlessly) hunting down any reference to the above subject. Does anyone know of such a reference? Thanks Charles Grasso (w) 303-706-5467 - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <[email protected]<mailto:[email protected]>> All emc-pstc postings are archived and searchable on the web at: http://www.ieee-pses.org/emc-pstc.html Attachments are not permitted but the IEEE PSES Online Communities site at http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used formats), large files, etc. Website: http://www.ieee-pses.org/ Instructions: http://www.ieee-pses.org/list.html (including how to unsubscribe)<http://www.ieee-pses.org/list.html> List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <[email protected]<mailto:[email protected]>> Mike Cantwell <[email protected]<mailto:[email protected]>> For policy questions, send mail to: Jim Bacher <[email protected]<mailto:[email protected]>> David Heald <[email protected]<mailto:[email protected]>> - ---------------------------------------------------------------- This message is from the IEEE Product Safety Engineering Society emc-pstc discussion list. To post a message to the list, send your e-mail to <[email protected]> All emc-pstc postings are archived and searchable on the web at: http://www.ieee-pses.org/emc-pstc.html Attachments are not permitted but the IEEE PSES Online Communities site at http://product-compliance.oc.ieee.org/ can be used for graphics (in well-used formats), large files, etc. Website: http://www.ieee-pses.org/ Instructions: http://www.ieee-pses.org/list.html (including how to unsubscribe) List rules: http://www.ieee-pses.org/listrules.html For help, send mail to the list administrators: Scott Douglas <[email protected]> Mike Cantwell <[email protected]> For policy questions, send mail to: Jim Bacher: <[email protected]> David Heald: <[email protected]>
