On 23.11.2009 12:20, Maciej Pijanka wrote: > On sun, 22 Nov 2009, Carl-Daniel Hailfinger wrote: > >> New version. >> >> Add the ability to generate test patterns for write testing. This will >> be useful once we create a --test function for flashrom. >> >> The test patterns make it easy to find skipped and duplicated bytes, are >> human readable, and the first 8 of them have block numbers to detect >> aliasing or wraparounds. Current size limit for aliasing detection >> is 16 MByte, but since neither LPC nor FWH nor SPI chips exist with >> bigger sizes, this is reasonably safe. >> > > I used previous version of this patch with success, only idea i had (but never > posted it yet) was adding way to differ between odd and even 16bytes blocks to > make more easier to detect stuck bits or something, but this isn't very > important > for generic usage. > But new version seems to address this issuess to, and code looks fine for me. > > Acked-by: Maciej Pijanka <[email protected]> >
Thanks for the review, r770. Regards, Carl-Daniel -- Developer quote of the month: "We are juggling too many chainsaws and flaming arrows and tigers." _______________________________________________ flashrom mailing list [email protected] http://www.flashrom.org/mailman/listinfo/flashrom
