This message is from the T13 list server.
On Tue, 12 Mar 2002 13:54:13 -0800, McGrath, Jim wrote: >This message is from the T13 list server. > >going forward it's not even clear that ECC will be linked with 512 byte >sectors. When I make my first "large physical sector" proposal I asked the T13 members to think about this and how they would continue to support R/W Long testing. Lets assume the current R/W Long scheme (Harlan's implementation or something similar) is used but the sectors are 4K bytes and there are up to 500 bytes of ECC data. Anyone want to estimate how long it would take just to walk a single "bad bit" though such a sector+ECC. Then how about walking a 2 "bad bits"? Or combinations of multiple errors? I'm not sure any of us would live long enough to see such a test complete (even if you could find a computer system that could run that long!). A question for those of you that buy disk drives... When you purchase a disk drive don't you assume that someone has verified that the drive's microprocessor(s) and buffer memory function correctly? (There has never been a way to test a microprocessor in a drive from a host system.) If you need to test a drive's ECC logic from the host, then why don't you also need to test the drive's microprocessor and buffer memory too from a host? Why the "double standard"? *** Hale Landis *** www.ata-atapi.com ***
