http://gcc.gnu.org/bugzilla/show_bug.cgi?id=46888



--- Comment #8 from Andrew Pinski <pinskia at gcc dot gnu.org> 2012-11-13 
01:18:52 UTC ---

http://gcc.gnu.org/ml/gcc-patches/2012-11/msg00952.html

Will improve the testcase at the tree level for little-endian:

  _4 = (unsigned char) a_3(D);

  _5 = (<unnamed-unsigned:5>) _4;

  BIT_FIELD_REF <D.1727, 10, 0> = 65;

  D.1727.c = 3;

  D.1727.d = _5;

  return D.1727;



And will fix it on big-endian:

  D.1354_2 = (unsigned char) a_1(D);

  D.1355_3 = (<unnamed-unsigned:5>) D.1354_2;

  BIT_FIELD_REF <D.1356, 15, 0> = 1091;

  D.1356.d = D.1355_3;

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