https://gcc.gnu.org/bugzilla/show_bug.cgi?id=66171
Bug ID: 66171
Summary: [6 Regression]: gcc.target/cris/biap.c
Product: gcc
Version: unknown
Status: UNCONFIRMED
Severity: normal
Priority: P3
Component: target
Assignee: unassigned at gcc dot gnu.org
Reporter: hp at gcc dot gnu.org
CC: vekumar at gcc dot gnu.org
Target Milestone: ---
Target: cris-elf
Before and including r222872, this test passed.
After and including r222878, this test fails:
Running /tmp/hpautotest-gcc0/gcc/gcc/testsuite/gcc.target/cris/cris.exp ...
FAIL: gcc.target/cris/biap.c scan-assembler addi
FAIL: gcc.target/cris/biap.c scan-assembler-not lsl
A qualified guess is that this is due to r222874.
See also PR37939, referenced in the test-case.
I'm logging this as target-specific and not a middle-end bug, as the canonical
RTL *is* shift, outside of a MEM. More than one pattern to edit: besides
changing that multiplication to a shift that need to be taken care of with the
canonically stricter RTL, like the side-effect pattern has to be duplicated as
noted 6+ years ago in
<http://gcc.gnu.org/ml/gcc-patches/2008-11/msg00025.html>.
(CC as FYI only.)
