https://gcc.gnu.org/bugzilla/show_bug.cgi?id=101283
--- Comment #8 from Iain Sandoe <iains at gcc dot gnu.org> --- we are now left with (where I suspect that the remaining fails are an artefact of the way in which Darwin represents offsets instead of relocations in DWARF debug sections): Running target unix/-m64 Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/btf/btf.exp ... FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t ]0xa000020[\t ]+[^\n]*btm_offset 1 FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t ]0x700002a[\t ]+[^\n]*btm_offset 1 FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t ]0x13000040[\t ]+[^\n]*btm_offset 1 FAIL: gcc.dg/debug/btf/btf-bitfields-2.c scan-assembler-times [\t ]0x20000020[\t ]+[^\n]*btm_offset 1 FAIL: gcc.dg/debug/btf/btf-bitfields-3.c scan-assembler-times [\t ]0x2[\t ]+[^\n]*btm_type 1 FAIL: gcc.dg/debug/btf/btf-bitfields-4.c scan-assembler-times [\t ]0x4000003[\t ]+[^\n]*btt_info 1 FAIL: gcc.dg/debug/btf/btf-cvr-quals-1.c scan-assembler-times [\t ]0xb000000[\t ]+[^\n]*btt_info 2 Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/ctf/ctf.exp ... FAIL: gcc.dg/debug/ctf/ctf-attr-mode-1.c scan-assembler-times [\t ]0x3[\t ]+[^\n]*ctv_typeidx 1 FAIL: gcc.dg/debug/ctf/ctf-cvr-quals-1.c scan-assembler-times [\t ]0[\t ]+[^\n]*ctt_name 7 FAIL: gcc.dg/debug/ctf/ctf-cvr-quals-1.c scan-assembler-times [\t ]0x36000000[\t ]+[^\n]*ctt_info 2 Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/debug.exp ... === gcc Summary for unix/-m64 === # of expected passes 1214 # of unexpected failures 10 # of unsupported tests 24 Running target unix/-m32 Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/btf/btf.exp ... FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t ]0xa000020[\t ]+[^\n]*btm_offset 1 FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t ]0x700002a[\t ]+[^\n]*btm_offset 1 FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t ]0x13000040[\t ]+[^\n]*btm_offset 1 FAIL: gcc.dg/debug/btf/btf-bitfields-2.c scan-assembler-times [\t ]0x20000020[\t ]+[^\n]*btm_offset 1 FAIL: gcc.dg/debug/btf/btf-bitfields-3.c scan-assembler-times [\t ]0x2[\t ]+[^\n]*btm_type 1 FAIL: gcc.dg/debug/btf/btf-bitfields-4.c scan-assembler-times [\t ]0x4000003[\t ]+[^\n]*btt_info 1 FAIL: gcc.dg/debug/btf/btf-cvr-quals-1.c scan-assembler-times [\t ]0xb000000[\t ]+[^\n]*btt_info 2 Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/ctf/ctf.exp ... FAIL: gcc.dg/debug/ctf/ctf-attr-mode-1.c scan-assembler-times [\t ]0x3[\t ]+[^\n]*ctv_typeidx 1 FAIL: gcc.dg/debug/ctf/ctf-cvr-quals-1.c scan-assembler-times [\t ]0[\t ]+[^\n]*ctt_name 7 FAIL: gcc.dg/debug/ctf/ctf-cvr-quals-1.c scan-assembler-times [\t ]0x36000000[\t ]+[^\n]*ctt_info 2 Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/debug.exp ... === gcc Summary for unix/-m32 === # of expected passes 1214 # of unexpected failures 10 # of unsupported tests 24 === gcc Summary === # of expected passes 2428 # of unexpected failures 20 # of unsupported tests 48