https://gcc.gnu.org/bugzilla/show_bug.cgi?id=118885
--- Comment #4 from GCC Commits <cvs-commit at gcc dot gnu.org> --- The master branch has been updated by Xi Ruoyao <xry...@gcc.gnu.org>: https://gcc.gnu.org/g:679e24f5a751663998ff7202149a749e0f7251f9 commit r16-3108-g679e24f5a751663998ff7202149a749e0f7251f9 Author: Harish Sadineni <harish.sadin...@windriver.com> Date: Sun Aug 10 20:28:00 2025 +0800 testsuite: i386: Fix gcc.target/i386/pr90579.c when PIE is enabled [PR118885] When gcc build with --enable-deafult-pie the following tests were getting failed: FAIL: gcc.target/i386/pr90579.c scan-assembler vaddsd\tr\\+40 FAIL: gcc.target/i386/pr90579.c scan-assembler vaddsd\tr\\+32 FAIL: gcc.target/i386/pr90579.c scan-assembler vaddsd\tr\\+24 FAIL: gcc.target/i386/pr90579.c scan-assembler vaddsd\tr\\+16 PR target/118885 gcc/testsuite/ChangeLog: * gcc.target/i386/pr90579.c: add -fno-pie to dg-options to fix tests when PIE is enabled. Signed-off-by: Harish Sadineni <harish.sadin...@windriver.com>
