https://gcc.gnu.org/bugzilla/show_bug.cgi?id=127519
--- Comment #2 from GCC Commits <cvs-commit at gcc dot gnu.org> --- The master branch has been updated by jeevitha <[email protected]>: https://gcc.gnu.org/g:be55954544d66a8500306c3e355dbff620db1be6 commit r17-5082-gbe55954544d66a8500306c3e355dbff620db1be6 Author: Jeevitha <[email protected]> Date: Mon Oct 12 03:46:19 2026 -0500 testsuite: Fix vec_xst_trunc test on Power10BE [PR127519] The expected values in builtin_altivec_tr_stxvr_runnable.c assume little-endian byte ordering. Use endian-specific expected values for the halfword, word and doubleword truncating stores so the testcase also passes on big-endian PowerPC. Also fix the DEBUG output to use the correct variable. 2026-10-12 Jeevitha Palanisamy <[email protected]> gcc/testsuite/ PR target/127519 * gcc.target/powerpc/builtin_altivec_tr_stxvr_runnable.c: Use endian-specific expected values for stxvr[hwd]x.
