Dear all. Does anyone know how to obtain the instrument resolution function (delta d/d) as a function of scattering vector Q from a Rietveld refinement performed on a standard sample (i.e. LaB6, Si, Ni, etc.) for both the constant wavelength case and for time-of-flight (TOF)?
Best wishes, --------------------------------------------------------------------------- Magnus Moe Nygård PhD-student Institute for Energy Technology, Neutron Materials Characterization (NØYTRON) Instituttveien 18, P. O. Box 40 NO-2027 Kjeller Phone: (+47) 41 42 66 26 www.ife.no<http://www.ife.no/>
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