> > Calling autopano-sift-c multiple times will result in a lot of > > duplicated work, probably what is needed is to go back to the old > > autopano-c-complete.sh script which will cache features as .key > > files between runs. >
I implemented also the two step approach. Now for multi-row panorama the feature descriptor is only running once per image, and then only the feature matcher runs agains all pairs. This will speed up the detection of cp with autopano-sift-c for multi-row panoramas. For autopano-sift-c try follow options: Type: Multi-row Detector: Two-step Feature descriptor: generatekeys Args: %i %k 800 Feature matcher: autopano Args: %o %k This will produce many temporary files. So have enough space in the temp path. Thomas
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