For Al:K edge is rather hard to find a dedicated beamline for XAS. Of
course are few where it can be measured, like in Bessy, Berlin U41-PGM,
or BL1A in UV-SOR, Okazaki, Japan, or BACH in Elettra, Trieste,
Itally. I do not how is situation in America, sorry.
In this energy region you have to measure in fluorescence, or which is
typical, in total electron yield (TEY). The sample, as your is, has to
be be conductive, and have a good electrical contact with sample holder.
Experimental geometry depends strongly on the vacuum chamber and
available instruments. At this energy can be visible effect of surface
contamination, especially for TEY, but must not. Sometimes LN2 cryostat
is also available.
is something more to add?
kicaj
W dniu 11-10-11 16:47, Kompch, Alexander pisze:
Dear all,
for the analysis of the location of the Al-dopant in ZnO, I am looking for
suitable EXAFS beamlines. Dopant concentrations are 1-10%. So far I have only
found ALS 6.3.1 and NSLS X15B.
Can anybody recommend beamlines for Al EXAFS?
My EXAFS experience is so far limited to the high energy range with signal
detection in transmission (ionization chambers) and fluorescence (multi-element
Ge-detectors). At such low energies as 1.5 keV for Al-K, the sample needs to be
in vacuum, transmission will not work and Ge detectors probably the same. Does
anybody have experience with Al-EXAFS, and can share a little about setup and
what other complications to expect?
Thank you,
Alex.
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