Date: Fri, 23 Jun 2000 10:09:34 +0200
From: Pascual Campoy <[EMAIL PROTECTED]>
We have developed a system for defect detection in paper pulp. The system
presently working performs an off-line measurement and the global product
quality is calculated by stadistics.
We are presently in the way of implementing the on-line version of the system.
You can find some more information in our web pages: www.disam.upm.es/vision
and link to: projects/visual inspection/automatic inspection and clasification
of TCF and ECF pulp a pdf summary of the system can be retrieval from:
www.disam.upm.es/vision/projects/papel/ispulp.pdf
I can send you some more information about the images acqusition sub-system or
about the processing algoritms.
Pascual Campoy
> Date: Thu, 22 Jun 2000 13:59:51 -0400
> From: [EMAIL PROTECTED]
> Subject: defect detection
>
> Hello,
> I am working on a potential project to observe and record defects on the
> surface of a strip of material as it moves down a process line. The material
> is flat and could be moving as fast as 400 feet per minute. The scratches and
> defects sometimes are not very large or deep. I would like to see it with a
> camera , record the video and if possible, trip an annunciator to call
> attention to the problem.
>
> Thank you in advance for your comments.
>
> Larry Zakem
> Electronic Eye
> [EMAIL PROTECTED]
--
_______________________________________________________________________
__
Pascual Campoy __/_/\_ http://www.disam.upm.es/vision
/______/\ email: [EMAIL PROTECTED]
DISAM \____ \ \
ETS Ingenieros Industriales / / /\ \ \ Phone: +34 91 7454660
Jose Gutierrez Abascal, 2 /_/ /__\__\ \ +34 91 3363061
28006 MADRID (SPAIN) \ \/______/ / Fax: +34 91 3363010
______________________________\________\/______________________________
