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https://issues.apache.org/jira/browse/FLINK-6917?page=com.atlassian.jira.plugin.system.issuetabpanels:all-tabpanel
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Konstantin Knauf updated FLINK-6917:
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Issue Type: Technical Debt (was: Test)
As part of https://issues.apache.org/jira/browse/FLINK-22029 the "Test" Issue
Type is removed. I migrated this one to "Technical Debt". If you think, this
should rather be an "Improvement" or "New Feature", feel free to change the
type.
> Introduce test base for end-to-end testing serializer config snapshotting,
> restoring, and compatibility check roundtrips
> -------------------------------------------------------------------------------------------------------------------------
>
> Key: FLINK-6917
> URL: https://issues.apache.org/jira/browse/FLINK-6917
> Project: Flink
> Issue Type: Technical Debt
> Components: API / Type Serialization System, Runtime / State
> Backends, Tests
> Reporter: Tzu-Li (Gordon) Tai
> Assignee: Tzu-Li (Gordon) Tai
> Priority: Major
> Labels: stale-assigned
>
> Currently, we only have end-to-end tests of the serializer snapshotting and
> restore roundtrip for the {{PojoSerializer}}, {{KryoSerializer}}, and Scala
> type serializers.
> They are all written differently with varying coverage of behavioural tests,
> and scattered in several different test classes.
> This JIRA tracks introducing a common test base for the serialization
> roundtrip for all serializers in Flink, and also activating it for all
> serializers.
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