Github user tillrohrmann commented on a diff in the pull request:
https://github.com/apache/flink/pull/3381#discussion_r102471183
--- Diff:
flink-libraries/flink-cep/src/test/java/org/apache/flink/cep/nfa/compiler/NFACompilerTest.java
---
@@ -42,6 +45,43 @@
public class NFACompilerTest extends TestLogger {
+ @Rule
+ public ExpectedException expectedException = ExpectedException.none();
+
+ @Test
+ public void testNFACompilerUniquePatternName() {
+
+ // adjust the rule
+ expectedException.expect(MalformedPatternException.class);
+ expectedException.expectMessage("Duplicate pattern name: start.
Pattern names must be unique.");
+
+ Pattern<Event, ?> invalidPattern =
Pattern.<Event>begin("start").where(new FilterFunction<Event>() {
+ private static final long serialVersionUID =
-3863103355752267133L;
+
+ @Override
+ public boolean filter(Event value) throws Exception {
+ return value.getName().equals("start");
+ }
+ }).followedBy("middle").subtype(SubEvent.class).where(new
FilterFunction<SubEvent>() {
+ private static final long serialVersionUID =
-1413973420880409702L;
+
+ @Override
+ public boolean filter(SubEvent value) throws Exception {
+ return value.getVolume() > 10.0;
+ }
+ }).followedBy("start").subtype(SubEvent.class).where(new
FilterFunction<SubEvent>() {
+ private static final long serialVersionUID =
-1413973420880409702L;
+
+ @Override
+ public boolean filter(SubEvent value) throws Exception {
+ return value.getVolume() > 11.0;
+ }
+ }).within(Time.milliseconds(10));
--- End diff --
Test pattern could be much more concise for the test case.
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