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https://issues.apache.org/jira/browse/FLINK-5864?page=com.atlassian.jira.plugin.system.issuetabpanels:comment-tabpanel&focusedCommentId=15887653#comment-15887653
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ASF GitHub Bot commented on FLINK-5864:
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Github user dawidwys commented on the issue:
https://github.com/apache/flink/pull/3390
Just had a second thought, this solution is temporary anyway, so that the
current Pattern graph is processed correctly. Before changing anything in
`NFACompiler` we will need to change the `process` function in NFACompiler.
We do not impose the first assumption, so not sure if we would benefit
anything from imposing the second one.
> CEP: fix duplicate output patterns problem.
> -------------------------------------------
>
> Key: FLINK-5864
> URL: https://issues.apache.org/jira/browse/FLINK-5864
> Project: Flink
> Issue Type: Bug
> Components: CEP
> Affects Versions: 1.3.0
> Reporter: Kostas Kloudas
> Assignee: Dawid Wysakowicz
> Fix For: 1.3.0
>
>
> Currently when searching for a pattern {{a,b,c}} and we have input elements
> {{a -> b1 -> b2 ->c}} where {{b1}} and {{b2}} are both valid elements for the
> position b, then instead of having an output of 2 matched patterns: {{a, b1,
> c}} and {{a, b2, c}}, we have 4, with 2 copies of each valid pattern.
> The problem is with the creation of Dewey number, cause it is not increased
> on graph branching.
>
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