I think David wrote: > Hi guys, > > I am thinking of using an AI system for crack detection. Basically, I am > doing some work in silicon wafer fabrication defect detection. The data > will be input from an source where it will resembles a crack. I am > trying to use some AI in this crack detection scheme. In the past, crack > detection is entirely done using human eyes. I wonder how feasible it is > to use Jess as an AI engine to identify these cracks from a visual > image. >
Well, the actual image analysis is not the sort of thing Jess is good for; you'd be far better off training a neural network, I think. What Jess -would- be good at in this domain is making decisions about what to do about a wafer: i.e., given 3 probable class 4 defects, 1 class 2 defect, should be pull that one wafer, let it pass, or shut down the whole production line? Given the pattern of defects, what is their likely cause, and what adjustments can be made to stop it? --------------------------------------------------------- Ernest Friedman-Hill Distributed Systems Research Phone: (925) 294-2154 Sandia National Labs FAX: (925) 294-2234 PO Box 969, MS 9012 [EMAIL PROTECTED] Livermore, CA 94550 http://herzberg.ca.sandia.gov -------------------------------------------------------------------- To unsubscribe, send the words 'unsubscribe jess-users [EMAIL PROTECTED]' in the BODY of a message to [EMAIL PROTECTED], NOT to the list (use your own address!) List problems? Notify [EMAIL PROTECTED] --------------------------------------------------------------------
