[EMAIL PROTECTED] wrote:
>  
>         1). Will it be possible to create a WCS profile (ie device
> profile , CAM profile and gamut profile) from an existing ICC profile
> without any extra data.

Technically possible (although some processing is required
for some of the current WCS profile types), but unnecessary,
since WCS is backwards compatible with ICCV4. There is a WCS
ICC tag that allows a WCS profile to be embedded within an ICC
profile, for transparent backwards compatibility.

>         2). What exactly is the objective measurement data used for
> creating the LUTs in WCS profile? Is it the same data used for creating
> the LUTs in ICC.

Essentially the same, although currently WCS imposes some limits currently
on the data sets used with certain profile types. ICC profiles have
to be created by a profile creation tool, and each tool will have
a slightly different set of requirements as to the data it needs.

>         3). ICC profiles are used to create "transforms on the fly " in
> ICM. Is it the same way which is done in WCS (apart from the fact that
> in WCS transforms are arrived from three profiles viz device, CAM and
> gamut)?

Well, no. Standard CMM's don't create transforms on the fly using ICC
profiles, the transforms are pre computed and stored in the profiles
(part of the creation process), and CMM's merely link them at run time.

In contrast, "smart" or "active" CMM's do create transforms on the fly,
and WCS is such a CMM. (This is part of its reason for existance.)

Graeme Gill.

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