On Thu, 2002-02-28 at 20:46, Ganesh S wrote: > Hi Harishankar > > Ofcourse, you can read the processor register and do many more stuff via > JTAG. That is provided you know the private JTAG instruction of the > processor on Assabet (ARM ?). This private instruction set is usually not > disclosed by the processor vendor in their Boundary scan description > language (BSDL) file. >
the SA1100/SA1110 is extremely limited in JTAG functionality, all one has to do is read the general SA1100 or SA1110 manual to get an overview. But, for your convience, I'll cut and paste. 16.6.1 Bypass Register Purpose: This is a single-bit register that can be selected as the path between TDI and TDO to allow the device to be bypassed during boundary-scan testing. Length: 1 bit Operating Mode: When the BYPASS instruction is the current instruction in the instruction register, serial data is transferred from TDI to TDO in the SHIFT-DR state with a delay of one TCK cycle.There is no parallel output from the bypass register. A logic 0 is loaded from the parallel input of the bypass register in the CAPTURE-DR state. 16.6.2 SA-1100 Device Identification (ID) Code Register Purpose: This register is used to read the 32-bit device identification code. No programmable supplementary identification code is provided. Length: 32 bits Operating Mode: When the IDCODE instruction is current, the ID register is selected as the serial path between TDI and TDO.The format of the ID register is as follows: 31 28 27 12 11 0 Version Part Number JEDEC Code The high-order 4 bits of the ID register contains the version number of the silicon and changes with each new revision. There is no parallel output from the ID register. The 32-bit device identification code is loaded into the ID register from its parallel inputs during the CAPTURE-DR state. 16.6.3 SA-1100 Boundary-Scan (BS) Register Purpose: The BS register consists of a serially connected set of cells around the periphery of the device, at the interface between the core logic and the system input/output pads. This register can be used to isolate the pins from the core logic and then drive or monitor the system pins. Operating Modes: The BS register is selected as the register to be connected between TDI and TDO only during the SAMPLE/PRELOAD and EXTEST instructions. Values in the BS register are used, but are not changed, during the CLAMP instruction. In the normal (system) mode of operation, straight-through connections between the core logic and pins are maintained, and normal system operation is unaffected. In TEST mode (when EXTEST is the currently selected instruction), values can be applied to the output pins independently of the actual values on the input pins and core logic outputs. On the SA-1100, all of the boundary-scan cells include update registers; thus, all of the pins can be controlled in the above manner. An additional boundary-scan cell is interposed in the scan chain to control the enabling of the data bus. The EXTEST guard values should be clocked into the boundary-scan register (using the SAMPLE/PRELOAD instruction) before the EXTEST instruction is selected, to ensure that known data is applied to the core logic during the test. These guard values should also be used when new EXTEST vectors are clocked into the boundary-scan register. The values stored in the BS register after power-up are not defined. Similarly, the values previously clocked into the BS register are not guaranteed to be maintained across a boundary-scan reset (from forcing nTRST low or entering the Test Logic Reset state). Figure 16-3, Figure 16-4, and Figure 16-5 show the typical timing for the BS register. _______________________________________________ http://lists.arm.linux.org.uk/mailman/listinfo/linux-arm http://www.arm.linux.org.uk/armlinux/mailinglists.php Please visit the above addresses for information on this list.
