On Wed,  8 Jun 2016 17:04:21 +0200
Boris Brezillon <boris.brezil...@free-electrons.com> wrote:

> Hello,
> 
> Sorry for the noise, but I forgot to add DT maintainers in Cc.
> 
> This series aims at standardizing a feature already supported by
> some NAND controller drivers: setting the maximum ECC strength
> based on the OOB area size instead of using the ECC strength/step_size
> information retrieved from the DT or NAND detection code.
> 
> This is particularly useful when the NAND device is used in by a
> FS/wear-leveling layer that is not using the OOB area at all (this is
> the case of UBI).
> 
> Note that drivers already implementing this kind of logic are not
> converted to the new approach (because of backward compatibility
> concern), but new drivers or drivers that do not already implement
> this 'ECC maximization' logic are encouraged to do it.

Applied.

> 
> Regards,
> 
> Boris
> 
> Boris Brezillon (3):
>   mtd: nand: Add an option to maximize the ECC strength
>   mtd: nand: Support maximizing ECC when using software BCH
>   mtd: nand: sunxi: Support ECC maximization
> 
>  Documentation/devicetree/bindings/mtd/nand.txt |  9 ++++++++
>  drivers/mtd/nand/nand_base.c                   | 23 ++++++++++++++++++++
>  drivers/mtd/nand/sunxi_nand.c                  | 29 
> ++++++++++++++++++++++++++
>  include/linux/mtd/nand.h                       |  1 +
>  4 files changed, 62 insertions(+)
> 

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