On Wed, 8 Jun 2016 17:04:21 +0200
Boris Brezillon <boris.brezil...@free-electrons.com> wrote:
> Sorry for the noise, but I forgot to add DT maintainers in Cc.
> This series aims at standardizing a feature already supported by
> some NAND controller drivers: setting the maximum ECC strength
> based on the OOB area size instead of using the ECC strength/step_size
> information retrieved from the DT or NAND detection code.
> This is particularly useful when the NAND device is used in by a
> FS/wear-leveling layer that is not using the OOB area at all (this is
> the case of UBI).
> Note that drivers already implementing this kind of logic are not
> converted to the new approach (because of backward compatibility
> concern), but new drivers or drivers that do not already implement
> this 'ECC maximization' logic are encouraged to do it.
> Boris Brezillon (3):
> mtd: nand: Add an option to maximize the ECC strength
> mtd: nand: Support maximizing ECC when using software BCH
> mtd: nand: sunxi: Support ECC maximization
> Documentation/devicetree/bindings/mtd/nand.txt | 9 ++++++++
> drivers/mtd/nand/nand_base.c | 23 ++++++++++++++++++++
> drivers/mtd/nand/sunxi_nand.c | 29
> include/linux/mtd/nand.h | 1 +
> 4 files changed, 62 insertions(+)