On Mon, Jan 07, 2019 at 12:34:31PM -0600, Gustavo A. R. Silva wrote:
> Cast get_unaligned_be32(...) to u64 in order to give the compiler
> complete information about the proper arithmetic to use and avoid
> a potential integer overflow.
>
> Notice that such function call is used in contexts that expect
> expressions of type u64 (64 bits, unsigned); and the following
> expressions are currently being evaluated using 32-bit
> arithmetic:
>
> val = get_unaligned_be32(&power->update_tag) *
> occ->powr_sample_time_us;
>
> val = get_unaligned_be32(&power->vdn.update_tag) *
> occ->powr_sample_time_us;
>
> Addresses-Coverity-ID: 1442357 ("Unintentional integer overflow")
> Addresses-Coverity-ID: 1442476 ("Unintentional integer overflow")
> Addresses-Coverity-ID: 1442508 ("Unintentional integer overflow")
> Fixes: ff692d80b2e2 ("hwmon (occ): Add sensor types and versions")
> Cc: [email protected]
> Signed-off-by: Gustavo A. R. Silva <[email protected]>
Applied.
Thanks,
Guenter
> ---
> drivers/hwmon/occ/common.c | 24 ++++++++++++------------
> 1 file changed, 12 insertions(+), 12 deletions(-)
>
> diff --git a/drivers/hwmon/occ/common.c b/drivers/hwmon/occ/common.c
> index 423903f87955..391118c8aae8 100644
> --- a/drivers/hwmon/occ/common.c
> +++ b/drivers/hwmon/occ/common.c
> @@ -380,8 +380,8 @@ static ssize_t occ_show_power_1(struct device *dev,
> val *= 1000000ULL;
> break;
> case 2:
> - val = get_unaligned_be32(&power->update_tag) *
> - occ->powr_sample_time_us;
> + val = (u64)get_unaligned_be32(&power->update_tag) *
> + occ->powr_sample_time_us;
> break;
> case 3:
> val = get_unaligned_be16(&power->value) * 1000000ULL;
> @@ -425,8 +425,8 @@ static ssize_t occ_show_power_2(struct device *dev,
> &power->update_tag);
> break;
> case 2:
> - val = get_unaligned_be32(&power->update_tag) *
> - occ->powr_sample_time_us;
> + val = (u64)get_unaligned_be32(&power->update_tag) *
> + occ->powr_sample_time_us;
> break;
> case 3:
> val = get_unaligned_be16(&power->value) * 1000000ULL;
> @@ -463,8 +463,8 @@ static ssize_t occ_show_power_a0(struct device *dev,
> &power->system.update_tag);
> break;
> case 2:
> - val = get_unaligned_be32(&power->system.update_tag) *
> - occ->powr_sample_time_us;
> + val = (u64)get_unaligned_be32(&power->system.update_tag) *
> + occ->powr_sample_time_us;
> break;
> case 3:
> val = get_unaligned_be16(&power->system.value) * 1000000ULL;
> @@ -477,8 +477,8 @@ static ssize_t occ_show_power_a0(struct device *dev,
> &power->proc.update_tag);
> break;
> case 6:
> - val = get_unaligned_be32(&power->proc.update_tag) *
> - occ->powr_sample_time_us;
> + val = (u64)get_unaligned_be32(&power->proc.update_tag) *
> + occ->powr_sample_time_us;
> break;
> case 7:
> val = get_unaligned_be16(&power->proc.value) * 1000000ULL;
> @@ -491,8 +491,8 @@ static ssize_t occ_show_power_a0(struct device *dev,
> &power->vdd.update_tag);
> break;
> case 10:
> - val = get_unaligned_be32(&power->vdd.update_tag) *
> - occ->powr_sample_time_us;
> + val = (u64)get_unaligned_be32(&power->vdd.update_tag) *
> + occ->powr_sample_time_us;
> break;
> case 11:
> val = get_unaligned_be16(&power->vdd.value) * 1000000ULL;
> @@ -505,8 +505,8 @@ static ssize_t occ_show_power_a0(struct device *dev,
> &power->vdn.update_tag);
> break;
> case 14:
> - val = get_unaligned_be32(&power->vdn.update_tag) *
> - occ->powr_sample_time_us;
> + val = (u64)get_unaligned_be32(&power->vdn.update_tag) *
> + occ->powr_sample_time_us;
> break;
> case 15:
> val = get_unaligned_be16(&power->vdn.value) * 1000000ULL;
