From: Rodrigo Alencar <[email protected]>
Add a KUnit test suite covering __iio_chan_prefix_emit(), the helper
that builds IIO sysfs attribute name prefixes from an iio_chan_spec.
The suite groups cases by the enum iio_shared_by mode it exercises:
- IIO_SHARED_BY_ALL: produces an empty prefix.
- IIO_SHARED_BY_DIR: emits direction only ("in" / "out").
- IIO_SHARED_BY_TYPE: emits "<dir>_<type>" and the differential
"<dir>_<type>-<type>" variant.
- IIO_SEPARATE: covers the full matrix of indexed, differential,
modified, output and extend_name combinations, plus the two
documented error paths (differential without indexed, differential
with modifier).
A final case exercises the seq_buf overflow path by passing an
undersized buffer and expects -EOVERFLOW.
Because __iio_chan_prefix_emit() is static, the test translation unit
is pulled into industrialio-core.c.
Also, an entry is created under MAINTAINERS dedicated to tests for IIO
core helpers.
Signed-off-by: Rodrigo Alencar <[email protected]>
---
MAINTAINERS | 8 +
drivers/iio/industrialio-core.c | 4 +
drivers/iio/test/Kconfig | 14 ++
drivers/iio/test/iio-test-channel-prefix.c | 246 +++++++++++++++++++++++++++++
4 files changed, 272 insertions(+)
diff --git a/MAINTAINERS b/MAINTAINERS
index 2b1ec46c5919..57ffc0dcfdb6 100644
--- a/MAINTAINERS
+++ b/MAINTAINERS
@@ -12634,6 +12634,14 @@ F: include/dt-bindings/iio/
F: include/linux/iio/
F: tools/iio/
+IIO CORE KUNIT TESTS
+M: Lars-Peter Clausen <[email protected]>
+M: Rodrigo Alencar <[email protected]>
+L: [email protected]
+S: Maintained
+F: drivers/iio/test/iio-test-channel-prefix.c
+F: drivers/iio/test/iio-test-format.c
+
IIO UNIT CONVERTER
M: Peter Rosin <[email protected]>
L: [email protected]
diff --git a/drivers/iio/industrialio-core.c b/drivers/iio/industrialio-core.c
index ecc69adf61de..78a3c27d17a1 100644
--- a/drivers/iio/industrialio-core.c
+++ b/drivers/iio/industrialio-core.c
@@ -2232,6 +2232,10 @@ EXPORT_SYMBOL_GPL(iio_device_get_current_mode);
subsys_initcall(iio_init);
module_exit(iio_exit);
+#if IS_ENABLED(CONFIG_IIO_CHANNEL_PREFIX_KUNIT_TEST)
+#include "test/iio-test-channel-prefix.c"
+#endif
+
MODULE_AUTHOR("Jonathan Cameron <[email protected]>");
MODULE_DESCRIPTION("Industrial I/O core");
MODULE_LICENSE("GPL");
diff --git a/drivers/iio/test/Kconfig b/drivers/iio/test/Kconfig
index 4fc17dd0dcd7..c355b0abd580 100644
--- a/drivers/iio/test/Kconfig
+++ b/drivers/iio/test/Kconfig
@@ -4,6 +4,20 @@
#
# Keep in alphabetical order
+config IIO_CHANNEL_PREFIX_KUNIT_TEST
+ bool "Test IIO channel prefix" if !KUNIT_ALL_TESTS
+ depends on KUNIT && IIO
+ default KUNIT_ALL_TESTS
+ help
+ Build unit tests for __iio_chan_prefix_emit(), the helper that
+ builds IIO sysfs attribute name prefixes from an iio_chan_spec.
+ The tests are compiled into the IIO core module.
+
+ For more information on KUnit and unit tests in general, please refer
+ to the KUnit documentation in Documentation/dev-tools/kunit/.
+
+ If unsure, say N.
+
config IIO_GTS_KUNIT_TEST
tristate "Test IIO gain-time-scale helpers" if !KUNIT_ALL_TESTS
depends on KUNIT
diff --git a/drivers/iio/test/iio-test-channel-prefix.c
b/drivers/iio/test/iio-test-channel-prefix.c
new file mode 100644
index 000000000000..e6f2739331f2
--- /dev/null
+++ b/drivers/iio/test/iio-test-channel-prefix.c
@@ -0,0 +1,246 @@
+// SPDX-License-Identifier: GPL-2.0
+/*
+ * Unit tests for IIO channel prefix generation.
+ */
+
+#include <kunit/test.h>
+
+#include <linux/iio/iio.h>
+#include <linux/limits.h>
+#include <linux/string.h>
+
+#define PREFIX_BUF_SIZE (NAME_MAX + 1)
+
+#define EXPECT_PREFIX(_test, _buf, _ret, _expected) do {
\
+ struct kunit *__test = (_test);
\
+ const char *__expected = (_expected);
\
+
\
+ KUNIT_EXPECT_EQ(__test, (_ret), (ssize_t)strlen(__expected));
\
+ KUNIT_EXPECT_STREQ(__test, (_buf), __expected);
\
+ } while (0)
+
+static char *iio_test_prefix_alloc(struct kunit *test)
+{
+ char *buf = kunit_kzalloc(test, PREFIX_BUF_SIZE, GFP_KERNEL);
+
+ KUNIT_ASSERT_NOT_ERR_OR_NULL(test, buf);
+ return buf;
+}
+
+static void iio_test_prefix_shared_by_all(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_VOLTAGE,
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SHARED_BY_ALL,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "");
+}
+
+static void iio_test_prefix_shared_by_dir(struct kunit *test)
+{
+ const struct iio_chan_spec chan_in = {
+ .type = IIO_VOLTAGE,
+ .output = 0,
+ };
+ const struct iio_chan_spec chan_out = {
+ .type = IIO_VOLTAGE,
+ .output = 1,
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan_in, IIO_SHARED_BY_DIR,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "in");
+
+ memset(buf, 0, PREFIX_BUF_SIZE);
+ ret = __iio_chan_prefix_emit(NULL, &chan_out, IIO_SHARED_BY_DIR,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "out");
+}
+
+static void iio_test_prefix_shared_by_type(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_VOLTAGE,
+ };
+ const struct iio_chan_spec chan_diff = {
+ .type = IIO_VOLTAGE,
+ .differential = 1,
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SHARED_BY_TYPE,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "in_voltage");
+
+ memset(buf, 0, PREFIX_BUF_SIZE);
+ ret = __iio_chan_prefix_emit(NULL, &chan_diff, IIO_SHARED_BY_TYPE,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "in_voltage-voltage");
+}
+
+static void iio_test_prefix_separate_simple(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_TEMP,
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SEPARATE,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "in_temp");
+}
+
+static void iio_test_prefix_separate_indexed(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_VOLTAGE,
+ .indexed = 1,
+ .channel = 3,
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SEPARATE,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "in_voltage3");
+}
+
+static void iio_test_prefix_separate_indexed_diff(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_VOLTAGE,
+ .indexed = 1,
+ .differential = 1,
+ .channel = 0,
+ .channel2 = 1,
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SEPARATE,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "in_voltage0-voltage1");
+}
+
+static void iio_test_prefix_separate_modified(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_ACCEL,
+ .modified = 1,
+ .channel2 = IIO_MOD_X,
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SEPARATE,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "in_accel_x");
+}
+
+static void iio_test_prefix_separate_extend_name(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_VOLTAGE,
+ .indexed = 1,
+ .channel = 2,
+ .extend_name = "supply",
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SEPARATE,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "in_voltage2_supply");
+}
+
+static void iio_test_prefix_output_separate(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_VOLTAGE,
+ .output = 1,
+ .indexed = 1,
+ .channel = 0,
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SEPARATE,
+ buf, PREFIX_BUF_SIZE);
+ EXPECT_PREFIX(test, buf, ret, "out_voltage0");
+}
+
+static void iio_test_prefix_diff_unindexed_fails(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_VOLTAGE,
+ .differential = 1,
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SEPARATE,
+ buf, PREFIX_BUF_SIZE);
+ KUNIT_EXPECT_EQ(test, ret, -EINVAL);
+}
+
+static void iio_test_prefix_diff_modified_fails(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_VOLTAGE,
+ .indexed = 1,
+ .differential = 1,
+ .modified = 1,
+ .channel = 0,
+ .channel2 = 1,
+ };
+ char *buf = iio_test_prefix_alloc(test);
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SEPARATE,
+ buf, PREFIX_BUF_SIZE);
+ KUNIT_EXPECT_EQ(test, ret, -EINVAL);
+}
+
+static void iio_test_prefix_overflow(struct kunit *test)
+{
+ const struct iio_chan_spec chan = {
+ .type = IIO_VOLTAGE,
+ };
+ char small[4];
+ ssize_t ret;
+
+ ret = __iio_chan_prefix_emit(NULL, &chan, IIO_SHARED_BY_TYPE,
+ small, sizeof(small));
+ KUNIT_EXPECT_EQ(test, ret, -EOVERFLOW);
+}
+
+static struct kunit_case iio_chan_prefix_test_cases[] = {
+ KUNIT_CASE(iio_test_prefix_shared_by_all),
+ KUNIT_CASE(iio_test_prefix_shared_by_dir),
+ KUNIT_CASE(iio_test_prefix_shared_by_type),
+ KUNIT_CASE(iio_test_prefix_separate_simple),
+ KUNIT_CASE(iio_test_prefix_separate_indexed),
+ KUNIT_CASE(iio_test_prefix_separate_indexed_diff),
+ KUNIT_CASE(iio_test_prefix_separate_modified),
+ KUNIT_CASE(iio_test_prefix_separate_extend_name),
+ KUNIT_CASE(iio_test_prefix_output_separate),
+ KUNIT_CASE(iio_test_prefix_diff_unindexed_fails),
+ KUNIT_CASE(iio_test_prefix_diff_modified_fails),
+ KUNIT_CASE(iio_test_prefix_overflow),
+ { }
+};
+
+static struct kunit_suite iio_channel_prefix_test_suite = {
+ .name = "iio-channel-prefix",
+ .test_cases = iio_chan_prefix_test_cases,
+};
+
+kunit_test_suite(iio_channel_prefix_test_suite);
--
2.43.0
