Hi, During the omap3camera development, we came across with the case of imaging sensors which can produce test patterns instead of capturing images from the CCD.
What we did in an attempt to keep an standard interface, is that we created a CID named V4L2_CID_TEST_PATTERN of integer type, so 0 is "no test pattern", and from 1 to any supported quantity, to select between supported pattern modes. So, do you think this is good approach? Or is it something which supports already this kind of setting? I think it is a pretty common feature in capturing devices. Regards, Sergio -- To unsubscribe from this list: send the line "unsubscribe linux-media" in the body of a message to majord...@vger.kernel.org More majordomo info at http://vger.kernel.org/majordomo-info.html
