From: Masayoshi Mizuma <m.miz...@jp.fujitsu.com>
KASAN reports following global out of bounds access while
nfit_test is being loaded. The out of bound access happens
the following reference to dimm_fail_cmd_flags[dimm]. 'dimm' is
over than the index value, NUM_DCR (==5).
---
static int override_return_code(int dimm, unsigned int func, int rc)
{
if ((1 << func) & dimm_fail_cmd_flags[dimm]) {
dimm_fail_cmd_flags[] definition:
static unsigned long dimm_fail_cmd_flags[NUM_DCR];
---
'dimm' is the return value of get_dimm(), and get_dimm() returns
the index of handle[] array. The handle[] has 7 index, and the
index #0 to #4 is for nfit_test.0 and #5, #6 is for nfit_test.1.
NUM_DCR is only for nfit_test.0. Let's add for nfit_test.1.
KASAN report:
==================================================================
BUG: KASAN: global-out-of-bounds in nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
Read of size 8 at addr ffffffffc10cbbe8 by task kworker/u41:0/8
...
Call Trace:
dump_stack+0xea/0x1b0
? dump_stack_print_info.cold.0+0x1b/0x1b
? kmsg_dump_rewind_nolock+0xd9/0xd9
print_address_description+0x65/0x22e
? nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
kasan_report.cold.6+0x92/0x1a6
nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
...
The buggy address belongs to the variable:
dimm_fail_cmd_flags+0x28/0xffffffffffffa440 [nfit_test]
==================================================================
Signed-off-by: Masayoshi Mizuma <m.miz...@jp.fujitsu.com>
---
tools/testing/nvdimm/test/nfit.c | 10 ++++++----
1 file changed, 6 insertions(+), 4 deletions(-)
diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index 9527d47a1070..38f066ce2f47 100644
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -104,6 +104,8 @@
enum {
NUM_PM = 3,
NUM_DCR = 5,
+ NUM_DCR_ALL = NUM_DCR + 2, /* 5 DCRs for test.0, 2 DCRs for test.1 */
+
NUM_HINTS = 8,
NUM_BDW = NUM_DCR,
NUM_SPA = NUM_PM + NUM_DCR + NUM_BDW,
@@ -140,8 +142,8 @@ static u32 handle[] = {
[6] = NFIT_DIMM_HANDLE(1, 0, 0, 0, 1),
};
-static unsigned long dimm_fail_cmd_flags[NUM_DCR];
-static int dimm_fail_cmd_code[NUM_DCR];
+static unsigned long dimm_fail_cmd_flags[NUM_DCR_ALL];
+static int dimm_fail_cmd_code[NUM_DCR_ALL];
static const struct nd_intel_smart smart_def = {
.flags = ND_INTEL_SMART_HEALTH_VALID
@@ -205,7 +207,7 @@ struct nfit_test {
unsigned long deadline;
spinlock_t lock;
} ars_state;
- struct device *dimm_dev[NUM_DCR];
+ struct device *dimm_dev[NUM_DCR_ALL];
struct nd_intel_smart *smart;
struct nd_intel_smart_threshold *smart_threshold;
struct badrange badrange;
@@ -2680,7 +2682,7 @@ static int nfit_test_probe(struct platform_device *pdev)
u32 nfit_handle = __to_nfit_memdev(nfit_mem)->device_handle;
int i;
- for (i = 0; i < NUM_DCR; i++)
+ for (i = 0; i < NUM_DCR_ALL; i++)
if (nfit_handle == handle[i])
dev_set_drvdata(nfit_test->dimm_dev[i],
nfit_mem);
--
2.18.0
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